Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Technical ProgramSession 8Wednesday 3/07/01 10:30AM<strong>Test</strong> And <strong>Burn</strong>-<strong>in</strong> At The Wafer Level“Wafer Level <strong>Burn</strong>-<strong>in</strong> And <strong>Test</strong>”Teresa McKenzie - MotorolaWalid Ballouli - MotorolaJohn Stroupe - Stroupe Consult<strong>in</strong>g“Some Scenarios On Wafer-Level <strong>Test</strong> & <strong>Burn</strong>-<strong>in</strong>”Robert Y. Million – Yamaichi Electronics USA, Inc.