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8th Liquid Matter Conference September 6-10, 2011 Wien, Austria ...

8th Liquid Matter Conference September 6-10, 2011 Wien, Austria ...

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Thu 811:<strong>10</strong>-14:00P7.123Forces between dissimilar surfaces in aqueous solution:the effect of electrochemical surface potentials, surfaceroughness and hydration layersMarkus Valtiner, 1 Kai Kristiansen, 1 George Greene, 1 and Jacob Israelachvili 11 University of California, Santa Barbara, Chemical Engineering, 93<strong>10</strong>6-5080,Santa Barbara, United States of AmericaA fundamental understanding of, and the ability to control, the interfacial interactions between materialsacross ultra small distances plays a critical role in colloid and interface science. The abilityto control and ’tune’ the forces in various device components remains a critical hurdle to optimizingdevice performance and reliability of, for example nanofluidic and lab-on-a-chip systems,aqueous-based MEMS, sensor devices; as well as novel devices where adhesion and adsorptioncan be controlled, surface contacts and wetting properties tuned, and single molecule or bi-layerinteractions manipulated. Surface morphology (including roughness) and electrostatic potentialdependentinteractions significantly affect the physical and mechanical properties of solid/liquidinterfaces and play a critical role in all of these systems. We describe the results of the first surfaceforce measurements under electrochemical potential control between metal and self-assembledfilmson ceramic surfaces across a liquid medium (water). Our experiments reveal how increasinglevels of surface roughness and dissimilarity between the potentials of the interacting surfaces influencethe strength and range of the electric double layer, van der Waals, hydration, and stericforces, and how these contribute to deviations from DLVO theory, particularly at distances lessthan two Debye lengths, or 2-3 times the rms rougness, whichever is greater.[1] Markus Valtiner, Kai Kristiansen, George W. Greene, Jacob N. Israelachvili, Advanced Materials,DOI: <strong>10</strong>. <strong>10</strong>02/adma. 20<strong>10</strong>03709 (<strong>2011</strong>)123

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