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Prospects of Colloidal Nanocrystals for Electronic - Computer Science

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<strong>Colloidal</strong> <strong>Nanocrystals</strong> in <strong>Electronic</strong> Applications Chemical Reviews, 2010, Vol. 110, No. 1 413<br />

Comparing the work function (�) <strong>of</strong> the metal electrode<br />

with energy levels <strong>of</strong> a NC can help in determining whether<br />

efficient charge injection is possible and whether high or low<br />

contact resistance is to be expected. The efficiency <strong>of</strong><br />

injection or extraction <strong>of</strong> carriers depends on the energy<br />

barriers that <strong>for</strong>m at the electrode/NC interface due to the<br />

difference in the work functions <strong>of</strong> contact material and the<br />

lowest unoccupied (<strong>for</strong> electron conductors) or highest<br />

occupied (<strong>for</strong> hole conductors) state <strong>of</strong> the NCs. A<br />

metal-semiconductor junction <strong>for</strong>ms an ohmic contact (i.e.,<br />

a contact with voltage independent resistance) if the Schottky<br />

barrier height, φB, is zero or negative. In such case, the<br />

carriers are free to flow in or out <strong>of</strong> the semiconductor so<br />

that there is a minimal resistance across the contact. A good<br />

ohmic contact is expected when the work function <strong>of</strong> the<br />

injecting metal is close to the highest occupied or lowest<br />

unoccupied states <strong>of</strong> the NCs. 360 In other words, <strong>for</strong> n-type<br />

material, the work function <strong>of</strong> the metal must be close to or<br />

smaller than the electron affinity <strong>of</strong> the semiconductor. The<br />

p-type semiconductor requires that the work function <strong>of</strong> the<br />

metal must be close to or larger than the sum <strong>of</strong> the electron<br />

affinity and the band gap energy. If these conditions are not<br />

satisfied, a potential barrier is <strong>for</strong>med, leading to poor charge<br />

injection and nonohmic contacts. High nonohmic contact<br />

resistance typically manifests itself in the transport measurements<br />

through I-V curves with suppressed current at low<br />

bias followed by superlinear increase <strong>of</strong> current at large<br />

applied voltages. High potential barriers at the metalsemiconductor<br />

interface combined with low semiconductor<br />

doping levels lead to <strong>for</strong>mation <strong>of</strong> blocking contacts, that<br />

is, the contacts that cannot inject charge carriers into<br />

semiconductor. This situation is demonstrated in Figure 29a,<br />

which shows the energy diagram <strong>for</strong> CdSe NCs <strong>of</strong> different<br />

size and different contact materials: indium-tin oxide (ITO),<br />

highly conductive polythiophene derivative PEDOT:PSS, and<br />

In-Ca eutectics. According to this energy diagram, electrons<br />

can easily flow from In-Ga eutectic (EGaIn) into the NCs,<br />

but not vice versa. PEDOT:PSS cannot inject either electrons<br />

or holes into the NCs, <strong>for</strong>ming a blocking contact. Indeed,<br />

Weiss et al. observed strong rectification behavior <strong>for</strong> a layer<br />

<strong>of</strong> CdSe NCs sandwiched between PEDOT:PSS and EGaIn<br />

in the device ITO/PEDOT:PSS/CdSe_NCs/EGaIn (Figure<br />

29b). 361,362<br />

The band gap energy <strong>of</strong> quantum confined semiconductors<br />

is strongly size dependent (Figures 3 and 29a), and size<br />

effects can play an important role because they determine<br />

absolute energies <strong>of</strong> the quantum-confined states in semiconductor<br />

NCs. 3,39 For example, Au contacts can readily<br />

inject holes into bulk lead sulfide and PbS NCs larger than<br />

∼6 nm. 24,265 At the same time, a positive potential barrier<br />

<strong>for</strong>ms at the interface between Au and small, <strong>for</strong> example, 2<br />

nm, PbS NCs. 363 Generally, both electrons and holes can flow<br />

from small into large semiconductor quantum dots, whereas<br />

the reverse flow will be an uphill process. Surface ligands<br />

can also affect the position <strong>of</strong> energy levels in semiconductor<br />

NCs. Tessler et al. demonstrated tuning <strong>of</strong> the electronic level<br />

positions with respect to the vacuum level in colloidal InAs<br />

NCs using different surface ligands. 364 Such size and ligand<br />

effects must be taken into account by designers <strong>of</strong> NC solar<br />

cells and other devices. 361,362<br />

In other examples, the work function <strong>of</strong> gold (� ) 5.1<br />

eV) is well aligned with the 1Sh state <strong>of</strong> 7 nm PbSe NCs<br />

(∼4.7 eV), which should lead to a low contact resistance.<br />

In contrast, it should be very difficult to inject electrons or<br />

Figure 29. (a) Energy diagram <strong>for</strong> the components <strong>of</strong> the ITO/<br />

PEDOT:PSS/CdSe_NCs/EGaIn junctions: the Fermi level <strong>of</strong> ITO,<br />

the valence and conduction bands <strong>of</strong> PEDOT:PSS, the 1Sh (HOMO)<br />

and 1Se (LUMO) levels <strong>of</strong> the 4.2 nm (S), 5.3 nm (M), and 9.8 nm<br />

(L) CdSe nanocrystals, and the Fermi level <strong>of</strong> In-Ga eutectic<br />

(EGaIn). The gray boxes indicate the uncertainty in the energies<br />

<strong>of</strong> the HOMOs and LUMOs <strong>of</strong> the nanocrystals. The arrow indicates<br />

the direction that the electrons move when V > 0, where the device<br />

turns on. (b) Plots <strong>of</strong> the absolute value <strong>of</strong> current J versus applied<br />

voltage V <strong>for</strong> the junctions ITO/PEDOT:PSS/CdSe NCs/EGaIn <strong>for</strong><br />

two different nanocrystal sizes. The junctions behave as diodes:<br />

electrons flow from EGaIn to ITO, but not vice versa. Reprinted<br />

with permission from ref 361. Copyright 2008 American Chemical<br />

Society.<br />

holes from Au into 4 nm CdSe NCs with 1Se state at ∼ -4.6<br />

eV and 1Sh state at ∼ -6.5 eV as compared to vacuum level;<br />

the contact resistance is expected to be very high. Bawendi<br />

et al. observed that Au <strong>for</strong>ms blocking contacts to ∼4 nm<br />

CdSe NCs, 263,269 preventing any detectable current in the NC<br />

film. At the same time, gold electrodes could inject holes<br />

into 1Sh state <strong>of</strong> CdTe NC film due to lower ionization<br />

potential <strong>of</strong> CdTe as compared to the CdSe phase. 296 Ohmic<br />

contact was observed between gold electrodes and PbS, 22,24,265,365<br />

PbSe, 23,25,366 and PbTe 87,357 NC solids. Sargent and Nozik<br />

groups reported <strong>for</strong>mation <strong>of</strong> hole-injecting ohmic contacts<br />

between indium-tin oxide (ITO) electrodes and PbS, 365<br />

PbSe 271,367 NCs.<br />

Doping <strong>of</strong> NC solids can play an important role in<br />

improving the contact resistance. In case <strong>of</strong> bulk semicon-

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