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Prospects of Colloidal Nanocrystals for Electronic - Computer Science

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436 Chemical Reviews, 2010, Vol. 110, No. 1 Talapin et al.<br />

I D ) WC i µ sat<br />

2L (V G - V T )2<br />

where µsat is the saturation regime field-effect mobility. This<br />

important parameter is typically calculated from the slope<br />

<strong>of</strong> [ID] 1/2 versus VG.<br />

The charge mobilities extracted from ID-VG curves are<br />

<strong>of</strong>ten higher in the saturated regime than those measured in<br />

the linear regime. This difference in measured carrier<br />

mobility can occur due to contact resistance when a large<br />

part <strong>of</strong> the source-drain voltage drops at the contacts and<br />

not across the channel, due to the presence <strong>of</strong> carrier trapping<br />

centers, etc. 6,557<br />

7.4.2. State-<strong>of</strong>-the-Art <strong>for</strong> Nanocrystal Transistors<br />

(50)<br />

The first inorganic FETs fabricated using colloidal semiconductor<br />

nanoparticles were reported in 1999 by Jacobson<br />

et al. 268 These devices were assembled from pyridine-capped<br />

CdSe NCs. Pyridine is a rather labile and volatile surface<br />

ligand, and annealing <strong>of</strong> the nanoparticle layer above 250<br />

°C allowed sintering <strong>of</strong> CdSe NCs into a polycrystalline<br />

CdSe film. Strictly speaking, the device reported by Jacobson<br />

et al. cannot be assigned to NC FETs because no NCs were<br />

present in the FET channel after annealing above 250 °C. The<br />

device annealed at 350 °C <strong>for</strong> 1 h showed a linear regime<br />

mobility (µlin) <strong>of</strong>1cm 2 /V · s, ION/IOFF ratio <strong>of</strong> 3.1 × 10 4 , and a<br />

threshold voltage <strong>of</strong> 6.7 V. The carrier mobility in those<br />

inorganic FETs was significantly greater than typical mobilities<br />

achieved <strong>for</strong> printed organic FETs. The conductance <strong>of</strong> the NC<br />

films was significantly increased by sintering,; however, the<br />

large concentration <strong>of</strong> structural defects limited the device<br />

switching speeds and induced large hysteresis <strong>of</strong> the ID-VG<br />

scans.<br />

NC-FETs with the conductive channels assembled <strong>of</strong><br />

close-packed quantum confined semiconductor NCs have<br />

been first reported by our team in 2005. 23 As starting material,<br />

we used PbSe NCs capped with oleic acid. Thin NC films<br />

fabricated by spin-coating or drop-casting were very insulating<br />

(σ ≈ 10 -10 Scm -1 ) and did not show any gate effect.<br />

However, replacement <strong>of</strong> bulky oleic acid with small<br />

hydrazine molecules by simply soaking NC films in 1 M<br />

solution <strong>of</strong> N2H4 in acetonitrile reduced the interparticle<br />

spacing from ∼1.2 to ∼0.4 nm and increases conductivity<br />

<strong>of</strong> PbSe NC films by ∼10 orders <strong>of</strong> magnitude. 23 As shown<br />

in Figure 52a, the size and shape, as well as the morphology<br />

<strong>of</strong> NC films, did not change after the threatment with<br />

hydrazine solution. Figure 52b shows a current modulation<br />

Ion/I<strong>of</strong>f <strong>of</strong> ∼2.5 × 10 3 <strong>for</strong> a PbSe NC n-FET. In the “on”<br />

state, the low-field specific conductance <strong>of</strong> PbSe NC film<br />

was ∼0.82 S cm -2 , and the current density in saturation<br />

regime approached 2.7 × 10 4 Acm -2 . Field-effect electron<br />

mobilities extracted from a series <strong>of</strong> devices yielded µlin ≈<br />

0.4 cm 2 V -1 s -1 and µsat ≈ 0.7 cm 2 V -1 s -1 in the saturation<br />

regime. Since then, technical improvements is sample<br />

preparation allowed one to achieve respectable electron<br />

mobility approaching µsat ≈ 2.5 cm 2 V -1 s -1 <strong>for</strong> 8 nm PbSe<br />

NC FETs, keeping the Ion/I<strong>of</strong>f ratio above 10 3 . 559 All <strong>of</strong> these<br />

numbers were reported <strong>for</strong> devices prepared at room temperature,<br />

without any heat treatment. Under these conditions,<br />

individual PbSe NCs preserved their QD-type electronic<br />

structure, confirmed by the observation <strong>of</strong> excitonic features<br />

Figure 52. Device characteristis <strong>of</strong> FETs made from ∼8 nm PbSe nanocrystals treated with 1MN2H4 in acetonitrile. (a) SEM images <strong>of</strong> the<br />

FET channel assembled from PbSe nanocrystals. (b) ID and ID 1/2 versus VG curves measured at a constant VDS ) 40 V <strong>for</strong> a n-channel FET, (c)<br />

ID versus VG plot at a constant VDS ) 1 V <strong>for</strong> an ambipolar FET. (d) ID-VDS plot at VDS )-40 V <strong>for</strong> a p-channel FET. Reprinted with permission<br />

from ref 23. Copyright 2005 American Association <strong>for</strong> Advancement <strong>of</strong> <strong>Science</strong>. (e) Extinction spectra <strong>of</strong> PbSe NC films, made from 7.4 nm<br />

nanocrystals, after various chemical treatments. Spectra are vertically <strong>of</strong>fset <strong>for</strong> clarity. Reprinted with permission from ref 560. Copyright 2009<br />

American Chemical Society.

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