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Prospects of Colloidal Nanocrystals for Electronic - Computer Science

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<strong>Colloidal</strong> <strong>Nanocrystals</strong> in <strong>Electronic</strong> Applications Chemical Reviews, 2010, Vol. 110, No. 1 423<br />

in virtually any semiconductor; however, development <strong>of</strong> a<br />

photoconductor with characteristics suitable <strong>for</strong> a particular<br />

application is a big scientific and technological challenge.<br />

There are several figures <strong>of</strong> merits used to characterize<br />

photoconductive photodetectors. 432,433 These are responsivity,<br />

spectral response, noise-equivalent power (NEP), detectivity,<br />

response time, and frequency response.<br />

Responsivity (Ri). This parameter is also <strong>of</strong>ten called<br />

sensitivity. The responsivity provides a quantitative measure<br />

<strong>for</strong> the output signal such as photocurrent iph per watt <strong>of</strong> the<br />

input optical power Pin. Ri is the function <strong>of</strong> both modulation<br />

frequency (f) and photon wavelength (λ):<br />

R i (f, λ) ) i ph<br />

P in<br />

Spectral response describes the spectral dependence <strong>of</strong> Ri,<br />

that is, the dependence <strong>of</strong> Ri versus λ. Typically, responsivity<br />

<strong>of</strong> IR detectors rises monotonically with increasing wavelength,<br />

then peaks and drops to zero upon reaching semiconductor<br />

band gap energy (so-called cut<strong>of</strong>f wavelength <strong>of</strong><br />

intrinsic photodetector). In NC photodetectors, the spectral<br />

response generally follows the shape <strong>of</strong> the NC absorption<br />

spectrum.<br />

Noise-Equivalent-Power. The internal noise current in is<br />

the main factor limiting the ability to detect small optical<br />

signals because the signal produced by the input power must<br />

be above the noise level. The noise-equivalent-power (NEP)<br />

is determined as a light power that yields a signal-to-noise<br />

ratio equal to 1 and can be expressed as:<br />

NEP ) i n<br />

R i<br />

Detectivity. For comparison <strong>of</strong> different devices, it is<br />

important to provide an area independent figure <strong>of</strong> merit D*<br />

(detectivity):<br />

D*(λ, f) ) R i √A∆f<br />

i n<br />

where A is the detector area. The detectivity D* is the rootmean-square<br />

signal-to-noise output when 1 W <strong>of</strong> monochromatic<br />

radiant flux modulated at frequency f is incident on 1<br />

cm 2 detector area, with a noise-equivalent bandwidth <strong>of</strong> 1<br />

Hz. D* is typically reported in Jones (1 Jones ) 1cmHz 1/2<br />

W -1 ).<br />

Response time (t). Response time, also known as the time<br />

constant, is calculated as follows:<br />

t ) 1<br />

2πf 3db<br />

(32)<br />

(33)<br />

where f3db is the frequency at which the signal power is 3<br />

dB lower than the value at zero frequency; that is, the<br />

photocurrent is 1/�2 ≈ 0.707 <strong>of</strong> that at zero frequency.<br />

Frequency Response. At low modulation frequencies, the<br />

photocurrent can follow the rise/decay <strong>of</strong> the illumination<br />

intensity. However, at higher frequencies, responsivity<br />

becomes a strong function <strong>of</strong> the response time:<br />

R 0<br />

R(f) )<br />

√1 + (2πft) 2<br />

(34)<br />

(35)<br />

(36)<br />

where R0 is the responsivity at zero frequency, and t is the<br />

response time.<br />

Other important characteristics <strong>of</strong> photodetectors are the<br />

linear dynamic range (the range over which detector responds<br />

linearly to the incident optical power) and the noise spectrum<br />

(i.e., the dependence <strong>of</strong> in vs f).<br />

7.2.2. Photoconductivity in Nanocrystal Solids<br />

A basic structure <strong>of</strong> the photoconductive detector is<br />

depicted in Figure 38. Ohmic contacts are attached to a slab<br />

or a thin film <strong>of</strong> a semiconductor. 434 For the latter case,<br />

smaller electrode spacings are accessible, favorable <strong>for</strong><br />

efficient collection <strong>of</strong> photogenerated charges. For NC-based<br />

photodetectors, thin film geometry is preferred because<br />

homogeneous submicrometer-thick NC films can be readily<br />

prepared from colloidal solutions. Furthermore, it is a<br />

common practice to use a substrate with lithographically<br />

defined electrodes and deposit a layer <strong>of</strong> NCs on top <strong>of</strong> the<br />

electrodes (Figure 38b).<br />

The photocurrent in a semiconductor can be generally<br />

described as:<br />

i ph ) ηeN λ G i<br />

(37)<br />

where η is the quantum efficiency (i.e., the number <strong>of</strong> excess<br />

carriers produced per absorbed photon), e is the elemental<br />

charge, Nλ is the number <strong>of</strong> photons <strong>of</strong> wavelength λ<br />

absorbed in the sample per unit time, and Gi is the internal<br />

(photoconductive) gain.<br />

Figure 38. (a) A sketch <strong>of</strong> typical thin film photoconductive<br />

photodetector. Interdigitate electrode structure is deposited onto the<br />

surface <strong>of</strong> active semiconductor. (b) A photodetector geometry that<br />

is typically used <strong>for</strong> NC-based devices: thin NC layer is deposited<br />

on top <strong>of</strong> the prepatterned electrode structure. Au is shown as an<br />

example <strong>of</strong> metal contact material.

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