Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
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P.I-13<br />
Deconvolution and Tip Geometry Effects in <strong>Atomic</strong>- and Nanoscale Kelvin probe<br />
<strong>Force</strong> <strong>Microscopy</strong><br />
George Elias 1 , Yossi Rosenwaks 1 , Amir Boag 1 , Ernst Meyer 2 , and Thilo Glatzel 2<br />
1 Dept. <strong>of</strong> Physical Electronics, Tel-Aviv University, Tel Aviv 69978, Israel<br />
2 Dept. <strong>of</strong> Physics, University <strong>of</strong> Basel, Klingelbergstr. 82, 4056 Basel, Switzerland<br />
In Kelvin probe force microscopy (KPFM) the long range electrostatic forces between the<br />
tip and the surface prevents quantitative measurement <strong>of</strong> nanostructures; however this<br />
can become feasible by developing appropriate deconvolution algorithms that restore the<br />
actual sample work function. We present such novel algorithms and methods that enable<br />
us to restore measurements conducted at tip-sample distances below 1 nm, while taking<br />
into account also the measured topography. Fitting the restored images with KPFM<br />
measurements <strong>of</strong> samples with well defined work function values has allowed us to<br />
extract the measuring tip geometry and validate our deconvolution methods.<br />
The three dimensional potential <strong>of</strong> the tip-sample system is calculated using an<br />
integral equation based boundary element method, combined with modeling the sample<br />
by an equivalent dipole-layer and image-charge model. The tip is modeled using MSC<br />
Patran finite element mesh, to create a high density mesh on the tip apex and a lower<br />
density mesh far from the sample as shown in Figure 1 (left). The middle figure shows a<br />
measured UHV-KPFM image <strong>of</strong> NaCl thin film grown on Cu (111) and a comparison<br />
with convolutions performed with 3 different tip apex radii (right). The excellent<br />
agreement obtained for a tip apex <strong>of</strong> 10nm allows to estimate the tip apex geometry, and<br />
helps to validate our convolution algorithms. Implications for real tip shapes (nanotips)<br />
and atomic resolution imaging is demonstrated and discussed<br />
Figure 1: (left) Full tip geometry mesh and tip apex mesh ; (middle) a KPFM measurement <strong>of</strong><br />
NaCl thin films grown on Cu(111); (right) a comparison between the measured KPFM line in the<br />
middle image and convolutions performed for 3 tip apex radii (half opening angle <strong>of</strong> 17.5º) <strong>of</strong> 3,<br />
6, and 10 nm.<br />
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