Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Charge transfer from doped silicon nanocrystals P.I-15 Łukasz BOROWIK 1 , Thuat NGUYEN-TRAN 2 , Pere ROCA i CABARROCAS 2 , Koku KUSIAKU 1 , Didier THERON 1 , Heinrich DIESINGER 1 , Dominique DEREMES 1 , and Thierry MELIN 1 1 Institut d’Electronique, de Microélectronique et de Nanotechnologie, CNRS-UMR 8520, Av . Poincaré, BP 60069, 59652 Villeneuve d’Ascq, France 2 Laboratoire de Physique des Interfaces et des Couches Minces, CNRS-UMR 7647, Ecole Polytechnique 91128 Palaiseau, France We present ultra-high vacuum (UHV) atomic force experiments performed on doped silicon nanocrystals fabricated by plasma enhanced chemical vapour deposition. The aim of this work is to study the doping properties and charge transfers from doped nanocrystals using UHV amplitude modulation Kelvin force microscopy (AM-KFM). The doping properties of hydrogen passivated nanocrystals are studied by monitoring the nanocrystal surface potential VS as a function of the nanocrystal and substrate doping, and also as a function of the nanocrystal size. The case of intrinsic nanocrystals is illustrated in Figure 1, in which the surface potential VS of the nanocrystals is plotted as a function of their height, showing - in average - positive or negative charge transfer from the p-doped and n-doped substrate, together with strong potential fluctuations attributed to the variation of the nanocrystal surface states. This situation is then compared to the case of n-doped nanocrystals, for which much lower potential fluctuations can be observed, and for which the nanocrystal surface potential VS is found almost independent of the doping level. These two effects are understood as stemming from the doping of the nanocrystal, which provides the necessary charge to compensate for the nanocrystal surface states, and induce a charge transfer to the substrate. The interpretation of the charge transfer equilibrium will be detailed quantitatively[1], using numerical simulations of the KFM signals taking into account capacitance averaging effects known to occur in KFM [2]. It will be shown that the charge transfer is enhanced due to the quantum confinement in nanocrystals with size
Open source scanning probe microscopy control and data analysis Percy Zahl 1 software package Gxsm. 1 Brookhaven National Laboratory, Center for Functional Nanomaterials, Upton NY 11973, USA P.I-16 Gxsm 1 is a full featured and modern scanning probe microscopy (SPM) software. It can be used both in stand alone mode for powerful image processing and analysis and connected to an instrument operating many different flavors of SPM, e.g., scanning tunneling microscopy (STM) and atomic force microscopy (AFM) or in general twodimensional multi-channel data acquisition instruments. The Gxsm core can handle different data types, e.g., integer and floating point numbers. An easily extendable plugin architecture provides many image analysis and manipulation functions. A powerful digital signal processor (DSP) subsystem runs the feedback loop, does optional adaptive real-time signal filtering, generates the scanning signals and acquires all the data during SPM measurements. We will show lastest results and demonstrate the performance of the new SignalRanger Mark2 and Analog A810 now supported by GXSM. The programmable Gxsm vector probe engine (real-time, DSP based) performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy (STS) or tip formation. The Gxsm software is released under the GNU general public license (GPL) and can be obtained via the Internet. Visit and follow the Gxsm home page for further information: 1 Homepage location: http://gxsm.sourceforge.net. 107
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
Page 57 and 58: Tu-1530 The Effective Quality Facto
Page 59 and 60: We-0900 Imaging Single Atoms on Oxi
Page 61 and 62: We-0940 Character of the short-rang
Page 63 and 64: We-1020 Local surface photovoltage
Page 65 and 66: We-1140 Theoretical DFT simulations
Page 67 and 68: We-1220 Theoretical study of the fo
Page 69 and 70: Steering the formation of molecular
Page 71 and 72: Molecular scale dissipation in olig
Page 73 and 74: Dependence of the atomic scale imag
Page 75 and 76: Th-0940 Intramolecular features of
Page 77 and 78: Th-1020 Adhesion-induced energy dis
Page 79 and 80: Measuring Atomic Charge States by n
Page 81 and 82: Th-1220 Controlling electron transf
Page 83 and 84: Oral Presentations Friday, 14 Augus
Page 85 and 86: Small amplitude atomic resolution N
Page 87 and 88: Fr-1000 Visualization of Anisotropi
Page 89 and 90: Atomic resolution dynamic lateral f
Page 91 and 92: Bimodal AFM imaging of antibodies a
Page 93 and 94: Poster Session I Tuesday, 11 August
Page 95 and 96: P.I-02 Force Map of Atomic Force Mi
Page 97 and 98: P.I-04 Improved atomic-scale contra
Page 99 and 100: P.I-06 Resonance frequency shift du
Page 101 and 102: P.I-08 Atomic force microscope cant
Page 103 and 104: Self-assembled Boronitride Nanomesh
Page 105 and 106: P.I-12 Resolution enhanced multifre
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Page 111 and 112: P.I-18 Design of a Variable Tempera
Page 113 and 114: P.I-20 Besocke style quartz tuning
Page 115 and 116: P.I-22 A homebuilt low-temperature
Page 117 and 118: P.I-24 High-Speed Frequency Modulat
Page 119 and 120: P.I-26 Deciphering Nanoscale Intera
Page 121 and 122: Dual-Frequency-Modulation AFM Spect
Page 123 and 124: P.I-30 Internal Resonances and Spat
Page 125 and 126: Relation between lateral forces and
Page 127 and 128: M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130: Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144: Molecular Resolution Investigation
Page 145 and 146: Development of Multifrequency High-
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
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P.II-29 Local Dielectric Spectrosco
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P.II-31 Polarization-dependent elec
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Magnetic Resonance Force Microscopy
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P.II-35 Enhancement of the Exchange
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Abe M. 51,58,92,141 Clerk A. A. 78
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Martinez N. F. 69 Parashar P. 31 Ma
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List of Participants 169
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Ido Shinichiro Kyoto University ido
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Wright Alan University of Maryland
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Ultra-high precision spatial positi
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AD VT-QPlus_ONUS / 09-May Nanotechn
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Surface Analysis Technology Aarhus
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Notes
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NC-AFM 2009 Sessions Monday August
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