Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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P.I-21 Design of a Low Temperature Noncontact Atomic Force Microscope Combined with a Field Ion Microscope J. Falter 1 , D.-A. Braun 1 , H. Hölscher 2 , U. D. Schwarz 3 , A. Schirmeisen 1 , and H. Fuchs 1 1 CeNTech Center for Nanotechnology and Institute of Physics, University of Münster, Germany 2 IMT, Forschungszentrum Karlsruhe, Germany 3 Department of Mechanical Engineering, Yale University, New Haven, USA Non-contact atomic force microscopy has become a standard tool for imaging surfaces with atomic resolution. The underlying contrast mechanism is influenced by both interaction partners, the sample as well as the tip. Theoretical simulations of the force interaction allow a deeper insight in the contrast mechanisms but require information about the exact position of all atoms of sample and the tip. A method that is able to determine the configuration of the probing tip with atomic precision is the field ion microscope (FIM). We present a home-built low temperature ultra high vacuum (UHV) system that combines these two microscopy techniques. The design of the AFM has been proven to operate in UHV at low temperature and features a high mechanical stability [1]. The original design was modified to use piezoelectric tuning forks as force sensors, with a glued-on tungsten wire, prepared by the double lamella etching technique [2] (Figure 1a). For stable oscillation, the tuning fork is excited electronically [3] in the frequency modulation mode. Our force sensors have been successfully employed in the AFM as well as the FIM. Figure 1b shows a FIM image of a tuning fork tungsten tip allowing the atom-by-atom reconstruction of the tip apex demonstrated in Figure 1c. a) b) c) Figure 1: a) Image of the tuning fork force sensor with glued-on tungsten wire. b) FIM image of a tuning fork tungsten tip, indicating the different crystallographic axis. A bright spot in the FIM image corresponds to a tip apex atom. c) Atom-by-atom reconstruction of the whole tip apex. [1] B. Albers et al, Rev. Sci. Instrum. 79 033704 (2008). [2] M. Kulawik et al, Rev. Sci. Instrum. 74, 1027 (2002) [3] J. Jersch et al, Rev. Sci. Instrum. 77, 083701 (2006) 112
P.I-22 A homebuilt low-temperature STM / tuning fork AFM combination Manfred Lange 1 , Johannes Schaffert 1 , Nikolai Wintjes 1 and Rolf Möller 1 1 Department of Physics, University of Duisburg-Essen, Germany We present details on a homebuilt, compact scanning probe microscope (Fig. 1) which can be switched between tuning fork AFM and STM operation without breaking vacuum. The geometry of the microscope resembles a cylinder with a height of only 15 cm and a diameter of 4 cm. It is attached to a commercially available continuous flow cryostat which allows cooling to about 5-7 K. Because of the very compact design, low helium consumption of only 1 liter/hour is achieved. Drift rates in lateral direction are
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
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Tu-1530 The Effective Quality Facto
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We-0900 Imaging Single Atoms on Oxi
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We-0940 Character of the short-rang
Page 63 and 64: We-1020 Local surface photovoltage
Page 65 and 66: We-1140 Theoretical DFT simulations
Page 67 and 68: We-1220 Theoretical study of the fo
Page 69 and 70: Steering the formation of molecular
Page 71 and 72: Molecular scale dissipation in olig
Page 73 and 74: Dependence of the atomic scale imag
Page 75 and 76: Th-0940 Intramolecular features of
Page 77 and 78: Th-1020 Adhesion-induced energy dis
Page 79 and 80: Measuring Atomic Charge States by n
Page 81 and 82: Th-1220 Controlling electron transf
Page 83 and 84: Oral Presentations Friday, 14 Augus
Page 85 and 86: Small amplitude atomic resolution N
Page 87 and 88: Fr-1000 Visualization of Anisotropi
Page 89 and 90: Atomic resolution dynamic lateral f
Page 91 and 92: Bimodal AFM imaging of antibodies a
Page 93 and 94: Poster Session I Tuesday, 11 August
Page 95 and 96: P.I-02 Force Map of Atomic Force Mi
Page 97 and 98: P.I-04 Improved atomic-scale contra
Page 99 and 100: P.I-06 Resonance frequency shift du
Page 101 and 102: P.I-08 Atomic force microscope cant
Page 103 and 104: Self-assembled Boronitride Nanomesh
Page 105 and 106: P.I-12 Resolution enhanced multifre
Page 107 and 108: P.I-14 Kelvin Force Microscopy Dyna
Page 109 and 110: Open source scanning probe microsco
Page 111 and 112: P.I-18 Design of a Variable Tempera
Page 113: P.I-20 Besocke style quartz tuning
Page 117 and 118: P.I-24 High-Speed Frequency Modulat
Page 119 and 120: P.I-26 Deciphering Nanoscale Intera
Page 121 and 122: Dual-Frequency-Modulation AFM Spect
Page 123 and 124: P.I-30 Internal Resonances and Spat
Page 125 and 126: Relation between lateral forces and
Page 127 and 128: M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130: Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144: Molecular Resolution Investigation
Page 145 and 146: Development of Multifrequency High-
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
Page 159 and 160: P.II-29 Local Dielectric Spectrosco
Page 161 and 162: P.II-31 Polarization-dependent elec
Page 163 and 164: Magnetic Resonance Force Microscopy
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P.II-35 Enhancement of the Exchange
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Abe M. 51,58,92,141 Clerk A. A. 78
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Martinez N. F. 69 Parashar P. 31 Ma
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List of Participants 169
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Ido Shinichiro Kyoto University ido
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Wright Alan University of Maryland
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Ultra-high precision spatial positi
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AD VT-QPlus_ONUS / 09-May Nanotechn
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Surface Analysis Technology Aarhus
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Notes
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NC-AFM 2009 Sessions Monday August
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