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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Static cantilever deflection in dynamic force microscopy<br />

S. Kawai, Th. Glatzel, S. Koch, B. Such, A. Barat<strong>of</strong>f, and E. Meyer<br />

Department <strong>of</strong> Physics, University <strong>of</strong> Basel, Klingelbergstr. 82, 4056 Basel Switzerland<br />

P.I-05<br />

So far, the influence <strong>of</strong> the time-averaged cantilever deflection in dynamic force<br />

microscopy (DFM) and spectroscopy [1] has been assumed negligibly small or constant,<br />

or else regarded as the source <strong>of</strong> jump-to-contact instabilities. But in fact, for a given tipsample<br />

distance <strong>of</strong> closest approach, the static deflection increases with decreasing<br />

oscillation amplitude. As a consequence, small-amplitude DFM is able to simultaneously<br />

detect the influence <strong>of</strong> atomic-scale interaction forces on time-averaged, as well as<br />

dynamic measured quantities. The use <strong>of</strong> higher resonances [2,3] is well-suited for this<br />

comparison because a typical static stiffness kc ~ 30 N/m can cause a measurable timeaveraged<br />

deflection. Nevertheless kc is still high enough to avoid cantilever jump-tocontact<br />

instabilities when a surface with a low reactivity is scanned with a sharp Si tip [4]<br />

We theoretically and experimentally studied the effects <strong>of</strong> the time-averaged<br />

deflection in DFM. Figure 1(a) and 1(b) shows a series <strong>of</strong> frequency shift and static<br />

deflection vs. distance curves measured using different amplitudes A2nd <strong>of</strong> the second<br />

flexural mode above a maximum <strong>of</strong> the topographic image <strong>of</strong> KBr(001). Figure 1(c)<br />

shows force vs. distance curves with and without compensation <strong>of</strong> the static deflection. It<br />

is found that the static deflection affects not only the Z-distance scale,<br />

but also the<br />

converted force. <strong>Force</strong> curves extracted from Δf2nd(Z) measured with different A2nd<br />

coincide if shifted along Z and exhibit a wiggle which is likely due to a sideways<br />

displacement <strong>of</strong> the tip apex towards a nearby counterion on the sample surface [1].<br />

Figure 1: A series <strong>of</strong> (a) frequency shift and (b) static deflection vs. distance curves. (c) <strong>Force</strong> vs.<br />

distance curves with (Zc) and without (Z’c) compensation <strong>of</strong> the static deflection.<br />

[1] A. Schirmeisen et al., Phys. Rev. Lett. 97, 136001 (2007).<br />

[2] S. Kawai et al., Appl. Phys. Lett. 86, 193107 (2005).<br />

[3] S. Kawai and H. Kawakatsu, Appl. Phys. Lett. 88, 133103 (2006)<br />

[4] S. Kawai and H. Kawakatsu, Phys. Rev. B 79, 115440 (2009).<br />

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