Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
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P.II-11<br />
Imaging Schwann Cell NGF Receptors using <strong>Atomic</strong> <strong>Force</strong> <strong>Microscopy</strong><br />
Ryan Williamson and Cheryl Miller<br />
Department <strong>of</strong> Biomedical <strong>Engineering</strong>, Saint Louis University, St Louis, MO, USA.<br />
Nerve growth factor (NGF) is a necessary neurotrophic agent that promotes neural<br />
survival and proliferation. Production <strong>of</strong> NGF by Schwann cells is essential for<br />
successful nerve regeneration. During neural axotomy and the resulting Wallerian<br />
degeneration, Schwann cells increase proliferation while axons and their myelin sheaths<br />
are degraded. The resulting formation, the band <strong>of</strong> Bungner, is crucial for guidance <strong>of</strong><br />
axon sprouts which form during regeneration. Schwann cells in the distal axon will<br />
express the high affinity NGF receptor tyrosine kinase A (TrkA) selectively in the bands<br />
<strong>of</strong> Bungner as well as the low affinity receptor p75. Using force measurements taken<br />
with a modified atomic force microscopy (AFM) tip to detect binding events, NGF<br />
receptor locations were identified. Using AFM with Schwann cells, we investigated the<br />
expression and conformation <strong>of</strong> NGF receptors. Receptor location and change during<br />
axon-Schwann cell contact could explain Schwann cell role during regeneration and<br />
possible clinical solutions.<br />
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