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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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P.II-31<br />

Polarization-dependent electron tunneling into ferroelectric surfaces<br />

Peter Maksymovych 1 , Stephen Jesse 1 , Pu Yu 2 , Ramamoorthy Ramesh 2 , Arthur P.<br />

Baddorf 1 , Sergei V. Kalinin 1<br />

1 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory<br />

2 Department <strong>of</strong> Physics and Dept. <strong>of</strong> Materials Science, University <strong>of</strong> California, Berkeley<br />

Electron tunneling underlies the operation <strong>of</strong> numerous devices relevant to<br />

information technology and has been proposed in futuristic applications for energy<br />

harvesting and quantum computing. Replacing a conventional insulator in the tunnel<br />

junction with electronically correlated materials can yield new types <strong>of</strong> electronic<br />

functionality. In one such concept, dubbed ferroelectric tunneling, the tunneling barrier<br />

height is controlled by the polarization <strong>of</strong> a ferroelectric oxide, enabling non-volatile<br />

conduction states that can be switched with electric field. Although ferroelectric<br />

tunneling has been a recent focus <strong>of</strong> a number <strong>of</strong> theoretical studies, aiming to unveil the<br />

interfacial behaviors <strong>of</strong> the ferroelectric order parameter, a convincing experimental<br />

demonstration <strong>of</strong> this phenomenon has been lacking. The key challenges are to find a<br />

material system that simultaneously satisfies the dimensional constraints for tunneling<br />

and ferroelectricity, as well as to assure that the conductance is not dominated by<br />

extrinsic effects due to charge injection and filamentary conduction, which is ubiquitous<br />

in complex oxides.<br />

In this talk we will demonstrate a highly reproducible polarization control <strong>of</strong> local<br />

electron transport through thin Pb(Zr0.2Ti0.8)O3 film. Despite being 30 nm thick,<br />

conductive atomic force microscopy revealed that the film possessed spatially and<br />

temporally reproducible local conductivity. Fowler-Nordheim electron tunneling was<br />

identified as the conductance mechanism, likely enabled by strong electric field in the<br />

sub-surface region (excess <strong>of</strong> 10 6 V/cm) created by the relatively sharp metal tip. Local<br />

conductance exhibited strong hysteresis depending on the probed bias range. Using a<br />

newly-developed combination <strong>of</strong> piezoresponse force and conductive atomic force<br />

microscopy, we have, for the first time, directly correlated local events <strong>of</strong> ferroelectric<br />

and resistive switching [1]. The large polarization <strong>of</strong> the studied film resulted in as high<br />

as 500-fold enhancement <strong>of</strong> the FN-tunneling conductance upon ferroelectric switching,<br />

sufficient to demonstrate a local non-volatile memory function.<br />

The physical mechanism <strong>of</strong> the observed effect was traced to the polarizationdependence<br />

<strong>of</strong> the height and possibly width <strong>of</strong> the metal-ferroelectric Schottky barrier.<br />

Our measurements have thus extended a well-known polarization dependence <strong>of</strong> surfacepotential<br />

on ferroelectric materials from Kevlin probe force microscopy to demonstrate<br />

local control <strong>of</strong> electron transport through such materials. Variable-temperature<br />

measurements and local effects due to dielectric non-linearities will also be discussed.<br />

[1] P. Maksymovych, S. Jesse, P. Yu, R. Ramesh, A. P. Baddorf, S. V. Kalinin, Science (2009) in review.<br />

159

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