Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
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Th-1000<br />
Analysis <strong>of</strong> bimodal and higher mode small-amplitude near-contact<br />
AFM and energy dissipation<br />
S. Kawai, A. Barat<strong>of</strong>f, Th. Glatzel, S. Koch, B. Such, and E. Meyer<br />
Department <strong>of</strong> Physics, University <strong>of</strong> Basel, Klingelbergstr. 82, 4056 Basel Switzerland<br />
Recently enhanced atomic-scale contrast was achieved on KBr(001) in UHV using<br />
resonant self-excitation <strong>of</strong> the lowest two cantilever flexural modes with constant tip<br />
oscillation amplitudes A1 >> A2 by monitoring the interaction induced frequency shift Δf2<br />
while controlling the closest approach distance z via Δf1 [1]. Optimum sensitivity and<br />
contrast in non-contact AFM using the 2 nd mode alone can in principle be achieved for z<br />
below the interatomic separation and A2 close to the range <strong>of</strong> the tip-sample interaction [2<br />
3]. Stable operation under such conditions can, however, be jeopardized by atomic jumps<br />
even if macroscopic jump-to-contact is prevented by using a sufficiently stiff deflection<br />
sensor. Simultaneous excitation <strong>of</strong> the fundamental mode with a large A1 alleviates this<br />
problem for reasons to be discussed.<br />
Under the stated conditions, Δf2 is to a good approximation proportional to the time<br />
average <strong>of</strong> the interaction force gradient over one cycle <strong>of</strong> the fundamental oscillation, as<br />
demonstrated and verified by simulations and measurements [1]. An application <strong>of</strong> the<br />
same argument to atomic-scale Kelvin <strong>Force</strong> <strong>Microscopy</strong> using voltage modulation at f2<br />
shows that the resulting deflection signal at f2 is proportional to the time average <strong>of</strong> the<br />
electrostatic force [4].<br />
Measurements to be reported separately using the 2 nd mode alone with amplitudes as<br />
small as 0.5 nm show smooth force vs. distance curves extracted from Δf2, as well as a<br />
small time-averaged deflection proportional to the time-average <strong>of</strong> the force.<br />
In all three cases, the site-dependent distance dependence <strong>of</strong> the time-averaged force<br />
gradient, electrostatic or total force can be extracted from the measured frequency shift,<br />
deflection signal at f = f2 or f = 0 using slightly modified versions <strong>of</strong> inversion algorithms<br />
proposed for single-mode non-contact AFM [5, 6]<br />
The magnitude, distance and amplitude dependences <strong>of</strong> the interaction-induced energy<br />
dissipation per oscillation cycle simultaneously measured using the 2 nd mode suggest that<br />
the dominant cause <strong>of</strong> dissipation is a force hysteresis loop narrower than twice A, but<br />
significantly smeared by thermal activation. However, some velocity-dependent<br />
damping with a coefficient decaying with increasing distance must also be present.<br />
Possible mechanisms and a hitherto ignored difficulty in extracting meaningful<br />
"dissipative forces" in the presence <strong>of</strong> both mechanisms will be discussed.<br />
[1] S. Kawai et al., submitted.<br />
[2] F. J. Giessibl et al., Appl. Surf. Sci.140, 352 (1999).<br />
[3] S. Kawai et al., Appl. Phys. Lett. 89, 023113 (2006).<br />
[4] S. Kawai et al., unpublished<br />
[5] O. Pfeiffer et al., Phys. Rev. B 65, 161403R (2002)<br />
[6].J. E. Sader and S. P. Jarvis, Appl. Phys. Lett. 84, 1801 (2004)<br />
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