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Noncontact Atomic Force Microscope Observation of TiO2(110) Surface in Pure Water Akira Sasahara 1 , Yonkil Jeong 1 , and Masahiko Tomitori 1 1 School of Materials Science, Japan Advanced Institute of Science and Technology, Ishikawa, Japan P.II-14 Titanum dioxide (TiO2) has a wide range of industrial applications such as pigments, optical devices, catalyst supports, photocatalysts, and photoelectrodes. A rutile TiO2(110) surface, which exhibits a simple truncation of the bulk structure (Fig. 1(a)) by simple cleaning procedures, has been most frequently employed in ultra high vacuum (UHV) studies to understand the origin of its properties. In many of the applications, TiO2 demonstrates the excellent properties in the presence of aqueous media. Nanoscale investigation of a well-defined rutile TiO2(110) surface in a liquid possibly provides further insight into the surface chemical properties of TiO2. We attempted noncontact atomic force microscope (NC-AFM) observation of TiO2(110) surface in pure water. The experiments were performed by using an intermittent contact mode atomic force microscope (5500 AFM/SPM, Agilent Technologies). The microscope was operated as an NC-AFM by using a phase locked loop detector (easy PLL plus, Nanosurf AG). The microscope was placed in a glass chamber, and imaging was performed under a flow of Ar. The TiO2(110) surface was cleaned by cycles of Ar + sputtering and annealing in UHV, removed from the vacuum chamber, and immersed in Ar-purged Milli-Q water. Figure 1(b) shows an NC-AFM image of the surface in water. Strings elongated to the [001] direction were observed. Along cross section 1 in Fig. 1(c), subnanometer corrugation was observed perpendicular to the rows. The distance between the lowest rows, indicated by arrowheads, was approximately 0.65 nm. On some of the rows, periodic corrugation was observed as shown in the cross sections 2 and 3. We attributed the lowest rows to the oxygen atom rows, and the corrugation along the rows to H2O clusters. Figure 1: (a) Ball model of a rutile TiO2(110)-(1×1) surface. Size of the unit cell is 0.65 nm×0.30 nm. (b) NC-AFM image of the TiO2(110) surface in pure water (15×15 nm 2 ). Frequency shift = +150 Hz, sample bias voltage = 0 V, peak-to-peak amplitude of the cantilever oscillation = 2 nm. (c) Cross sections obtained along the lines in the image. 142
Development of Multifrequency High-speed NC-AFM in Liquid Y. J. Li 1,2 , K. Takahashi 1 , N. Kobayashi 1 , Y. Naitoh 1,2 , M. Kageshima 1,2 and Y. Sugawara 1,2 1 Department of Applied Physics, Osaka University and 2 CREST, Japan P.II-15 AFM is a power tool to observe the solid-liquid interface, and it has succeeded in true atomic-resolution imaging on the nano-scale. Especially, the high-speed imaging is useful for understanding the dynamic behavior of biomolecules and the clarification of the physical phenomena that happen in the solid-liquid interface. In order to clarify unknown physical phenomena on the surface, not only the topography image and energy dissipation image but also elasticity including the information of surface physical properties is also necessary. Previously, we have succeeded in simultaneous imaging topography and energy dissipation image by our developed high-speed phase-modulation AFM (PM-AFM) in constant-amplitude (CA) mode [1-2]. Recently, Garcia et al have developed a theory of the multifrequency method in AM-AFM [3]. So far, the multifrequency method for measuring elasticity by high-speed PM-AFM in CA mode has not been developed yet. In this research, we develop the multifrequency high-speed PM-AFM in CA mode with the capability of simultaneous imaging elasticity in liquid. From the theory and the experiment, we discuss the multifrequency method in high-speed PM-AFM in CA mode. The high-speed elasticity image can be measured by phase shift Ф2from high-speed phase detector with the bandwidth of 3MHz (the second resonance mode). We demonstrate the multifunctional high-speed images of polymer film with the scan speed of 10 frames /s in water. (a) (b) (c) Figure 2 (a) topographic, (b) energy dissipation and (c) elasticity images of polymer film with 10frames/s. 300x300nm 2 . f1 =600 kHz, f2 =3MHz. [1] N. Kobayashi et, al., Jpn. J. Appl. Phys., 45 (2006) L793. [2] Y. Sugawara, et, al., Appl. Phys. Lett., 90 (2007) 194104. [3] J. R. Lozano and R. Garcia, Phys. Rev. Lett., 100 (2008) 076102. 143
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
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Tu-1530 The Effective Quality Facto
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We-0900 Imaging Single Atoms on Oxi
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We-0940 Character of the short-rang
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We-1020 Local surface photovoltage
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We-1140 Theoretical DFT simulations
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We-1220 Theoretical study of the fo
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Steering the formation of molecular
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Molecular scale dissipation in olig
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Dependence of the atomic scale imag
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Th-0940 Intramolecular features of
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Th-1020 Adhesion-induced energy dis
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Measuring Atomic Charge States by n
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Th-1220 Controlling electron transf
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Oral Presentations Friday, 14 Augus
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Small amplitude atomic resolution N
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Fr-1000 Visualization of Anisotropi
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Atomic resolution dynamic lateral f
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Bimodal AFM imaging of antibodies a
Page 93 and 94: Poster Session I Tuesday, 11 August
Page 95 and 96: P.I-02 Force Map of Atomic Force Mi
Page 97 and 98: P.I-04 Improved atomic-scale contra
Page 99 and 100: P.I-06 Resonance frequency shift du
Page 101 and 102: P.I-08 Atomic force microscope cant
Page 103 and 104: Self-assembled Boronitride Nanomesh
Page 105 and 106: P.I-12 Resolution enhanced multifre
Page 107 and 108: P.I-14 Kelvin Force Microscopy Dyna
Page 109 and 110: Open source scanning probe microsco
Page 111 and 112: P.I-18 Design of a Variable Tempera
Page 113 and 114: P.I-20 Besocke style quartz tuning
Page 115 and 116: P.I-22 A homebuilt low-temperature
Page 117 and 118: P.I-24 High-Speed Frequency Modulat
Page 119 and 120: P.I-26 Deciphering Nanoscale Intera
Page 121 and 122: Dual-Frequency-Modulation AFM Spect
Page 123 and 124: P.I-30 Internal Resonances and Spat
Page 125 and 126: Relation between lateral forces and
Page 127 and 128: M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130: Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143: Molecular Resolution Investigation
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
Page 159 and 160: P.II-29 Local Dielectric Spectrosco
Page 161 and 162: P.II-31 Polarization-dependent elec
Page 163 and 164: Magnetic Resonance Force Microscopy
Page 165 and 166: P.II-35 Enhancement of the Exchange
Page 167 and 168: Abe M. 51,58,92,141 Clerk A. A. 78
Page 169 and 170: Martinez N. F. 69 Parashar P. 31 Ma
Page 171 and 172: List of Participants 169
Page 173 and 174: Ido Shinichiro Kyoto University ido
Page 175 and 176: Wright Alan University of Maryland
Page 177 and 178: Ultra-high precision spatial positi
Page 179 and 180: AD VT-QPlus_ONUS / 09-May Nanotechn
Page 181: Surface Analysis Technology Aarhus
Page 184 and 185: Notes
Page 186: NC-AFM 2009 Sessions Monday August
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