Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Institutional Sponsors Yale Center for Research on Interface Structures and Phenomena Past Conferences Osaka, Japan (1998) Pontresina, Switzerland (1999) Hamburg, Germany (2000) Kyoto, Japan (2001) Montreal, Canada (2002) Dingle, Ireland (2003) Seattle, USA (2004) Osnabrück, Germany (2005) Kobe, Japan (2006) Antalya, Turkey (2007) Madrid, Spain (2008) Forthcoming Conference Kanazawa, Japan (2010) Udo D. Schwarz Dept. of Mechanical Engineering Yale University New Haven, CT 06515, USA udo.schwarz@yale.edu Cover Page: Banner of Yale University (1.8 µm � 1.8 µm), written into a PMMA film by dynamic force microscopy. Image by M. Heyde & U. D. Schwarz Left: Harkness Tower on Yale Campus. • Yale School of Engineering • Departments of Mechanical, Electrical, and Chemical Engineering • Department of Physics Endorsed Topical Conference www.avs.org
Welcome Dear conference participant: Welcome to the 12th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2009), which is held on historic Yale University campus in New Haven, CT, USA. It continues a series of international conferences constituted 1998 in Osaka, Japan. Since then, the annual NC-AFM conferences have been established as the leading events for NC-AFM related topics. This year’s meeting has again attracted a large number of participants (over 130 attendees from 17 countries), who are contributing 43 oral and 71 poster presentations. 15 additional talks are provided by the Satellite Workshop on Casimir Forces and Their Measurement, and seven companies feature their newest products in an exhibition. Like in other years, the scientific program showcases the rapid development that NC-AFM enjoys. Various experimental improvements such as high-stability measurements performed at low temperatures, novel stiff self-sensing oscillators with atomically controlled tips that allow chemical identification and tunneling current collection, drift compensation by forward-feedbacking, atom tracking, and post-acquisition drift correction, and all-digital high-speed, low-noise electronics enable a new level of sophistication in imaging, analysis, and atom manipulation. Progress is particularly remarkable for high-resolution data acquisition in liquids, demonstrating that NC-AFM is leaving its ultrahigh vacuum niche. The main conference is complemented by a Satellite Workshop on Casimir Forces and Their Measurement (Casimir 2009). Designed to stimulate discussion between the Casimir and the NC-AFM communities, the Casimir 2009 workshop has been well received (87 participants). Credit for initiating this event goes to Woo-Joong Kim, who was aided in its organization by Alex Sushkov and Steven K. Lamoreaux. Contributions by many key players were indispensable in realizing this conference, among them the ones by the members of the Local Organizing Committee (Eric I. Altman, Hong X. Tang, and Woo-Joong Kim) and by the team of the Yale Conference Service under the supervision of Susan Adler. Special thanks go to Mehmet Baykara for his help with various practical aspects such as the design of this abstract booklet. We were also fortunate to receive significant support from numerous Yale entities, whose generous financial assistance made this conference possible, from the European Science Foundation through its “New Trends and Applications of the Casimir Effect” program, and from the American Vacuum Society, which arranged for the publication of the conference proceedings. The complete list of institutional sponsors can be found opposite to this page; corporative sponsors and exhibitors are listed on page 9. We hope that you will enjoy the conference and have a wonderful time in New Haven. Udo D. Schwarz, Conference Chair 1
Page 1: 12 th International Conference on N
Page 5 and 6: Topics • Atomic resolution imagin
Page 7 and 8: Committees Program Committee Jaime
Page 9 and 10: General Information (cont.) Oral Pr
Page 11 and 12: Exhibitors 9
Page 13 and 14: Proceedings (cont.) 3. Length: Pape
Page 15 and 16: Conference Program 13
Page 17 and 18: Program Summary of the NC-AFM 2009
Page 19 and 20: Monday, August 10 Satellite Worksho
Page 21 and 22: Wednesday, August 12 Oxides Chair:
Page 23 and 24: Friday, August 14 Method Developmen
Page 25 and 26: Poster Session I cont. (Tuesday) In
Page 27 and 28: POSTER Session II (Wednesday) Molec
Page 29 and 30: Poster Session II cont. (Wednesday)
Page 31 and 32: Non-retarded and retarded interacti
Page 33 and 34: Mo-0955 Multiple Scattering Casimir
Page 35 and 36: Diego Dalvit 1 Dispersive Casimir i
Page 37 and 38: Using Casimir and capillary forces
Page 39 and 40: Near-field radiative heat transfer
Page 41 and 42: Mo-1615 Tricks and facts in a high
Page 43 and 44: Measuring the topological dependenc
Page 45 and 46: Mo-1755 Contact potential differenc
Page 47 and 48: 3D Scanning Force Microscopy at Sol
Page 49 and 50: Tu-1000 Experimental and Theoretica
Page 51 and 52: Dynamic Force Spectroscopy of Singl
Page 53 and 54:
Simultaneous measurement of force a
Page 55 and 56:
Water, Ions, Membranes, Real Metals
Page 57 and 58:
Tu-1530 The Effective Quality Facto
Page 59 and 60:
We-0900 Imaging Single Atoms on Oxi
Page 61 and 62:
We-0940 Character of the short-rang
Page 63 and 64:
We-1020 Local surface photovoltage
Page 65 and 66:
We-1140 Theoretical DFT simulations
Page 67 and 68:
We-1220 Theoretical study of the fo
Page 69 and 70:
Steering the formation of molecular
Page 71 and 72:
Molecular scale dissipation in olig
Page 73 and 74:
Dependence of the atomic scale imag
Page 75 and 76:
Th-0940 Intramolecular features of
Page 77 and 78:
Th-1020 Adhesion-induced energy dis
Page 79 and 80:
Measuring Atomic Charge States by n
Page 81 and 82:
Th-1220 Controlling electron transf
Page 83 and 84:
Oral Presentations Friday, 14 Augus
Page 85 and 86:
Small amplitude atomic resolution N
Page 87 and 88:
Fr-1000 Visualization of Anisotropi
Page 89 and 90:
Atomic resolution dynamic lateral f
Page 91 and 92:
Bimodal AFM imaging of antibodies a
Page 93 and 94:
Poster Session I Tuesday, 11 August
Page 95 and 96:
P.I-02 Force Map of Atomic Force Mi
Page 97 and 98:
P.I-04 Improved atomic-scale contra
Page 99 and 100:
P.I-06 Resonance frequency shift du
Page 101 and 102:
P.I-08 Atomic force microscope cant
Page 103 and 104:
Self-assembled Boronitride Nanomesh
Page 105 and 106:
P.I-12 Resolution enhanced multifre
Page 107 and 108:
P.I-14 Kelvin Force Microscopy Dyna
Page 109 and 110:
Open source scanning probe microsco
Page 111 and 112:
P.I-18 Design of a Variable Tempera
Page 113 and 114:
P.I-20 Besocke style quartz tuning
Page 115 and 116:
P.I-22 A homebuilt low-temperature
Page 117 and 118:
P.I-24 High-Speed Frequency Modulat
Page 119 and 120:
P.I-26 Deciphering Nanoscale Intera
Page 121 and 122:
Dual-Frequency-Modulation AFM Spect
Page 123 and 124:
P.I-30 Internal Resonances and Spat
Page 125 and 126:
Relation between lateral forces and
Page 127 and 128:
M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130:
Contacting self-ordered molecular w
Page 131 and 132:
Molecular Structures of Organic Sin
Page 133 and 134:
One and Two Dimensional Structure o
Page 135 and 136:
Temperature-dependent growth of C60
Page 137 and 138:
P.II-07 Atomic Force Microscopy Stu
Page 139 and 140:
Imaging and Detection of Single Mol
Page 141 and 142:
P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144:
Molecular Resolution Investigation
Page 145 and 146:
Development of Multifrequency High-
Page 147 and 148:
Noncontact observation in liquid wi
Page 149 and 150:
P.II-19 Cantilever Holder Design fo
Page 151 and 152:
P.II-21 Manipulation Mechanism of S
Page 153 and 154:
nc-AFM Investigations of Metal Nano
Page 155 and 156:
P.II-25 Contrast formation on cross
Page 157 and 158:
P.II-27 Non-contact scanning nonlin
Page 159 and 160:
P.II-29 Local Dielectric Spectrosco
Page 161 and 162:
P.II-31 Polarization-dependent elec
Page 163 and 164:
Magnetic Resonance Force Microscopy
Page 165 and 166:
P.II-35 Enhancement of the Exchange
Page 167 and 168:
Abe M. 51,58,92,141 Clerk A. A. 78
Page 169 and 170:
Martinez N. F. 69 Parashar P. 31 Ma
Page 171 and 172:
List of Participants 169
Page 173 and 174:
Ido Shinichiro Kyoto University ido
Page 175 and 176:
Wright Alan University of Maryland
Page 177 and 178:
Ultra-high precision spatial positi
Page 179 and 180:
AD VT-QPlus_ONUS / 09-May Nanotechn
Page 181:
Surface Analysis Technology Aarhus
Page 184 and 185:
Notes
Page 186:
NC-AFM 2009 Sessions Monday August
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