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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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P.II-21<br />

Manipulation Mechanism <strong>of</strong> Single Cu Atoms on Cu(110)-O Surface<br />

with Low Temperature Non-Contact AFM<br />

Y. Kinoshita, T. Satoh, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara<br />

Department <strong>of</strong> Applied Physics, Graduate <strong>School</strong> <strong>of</strong> <strong>Engineering</strong>, Osaka University Osaka, Japan<br />

Atom manipulation is a fascinating technique for artificially fabricating nanometer<br />

scale structures. Recently using non-contact atomic force microscopy (NC-AFM), the<br />

well-controlled manipulations <strong>of</strong> individual atoms [1] or molecules on surfaces were<br />

demonstrated. Furthermore, using the force spectroscopy techniques, atomic force-vector<br />

field [2] or driving forces involved in a single atom manipulation [3] were determined.<br />

More recently our group have successfully manipulated single topmost Cu atoms<br />

laterally on Cu(110)-O surfaces and identified manipulation modes (pulling or pushing)<br />

from the AFM feedback signals. At the same time, we found that the atom species (Cu or<br />

O) <strong>of</strong> the tip apex changes not only the AFM topographic images drastically but also the<br />

mode for lateral manipulation <strong>of</strong> a Cu atom on the surface. However the difference in tipsample<br />

potential energy from the species <strong>of</strong> the tip apex has still been unclear. In this<br />

study, we investigate the potential distributions depending on the species <strong>of</strong> the topmost<br />

atom on the tip and clarify the different mechanisms for lateral manipulation <strong>of</strong> Cu atoms<br />

All measurements were performed in ultrahigh vacuum at 78 K. By using the image<br />

tracking scheme, the precise positioning <strong>of</strong> the tip with small drift velocity

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