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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Poster Session II cont. (Wednesday)<br />

P.II-33 Magnetic Resonance <strong>Force</strong> <strong>Microscopy</strong> in Anisotropic Systems<br />

T. Fan, V. I. Tsifrinovich<br />

P.II-34 Sub-10 nm resolution in Magnetic <strong>Force</strong> <strong>Microscopy</strong> (MFM) at ambient conditions<br />

Ö. Karcı, H. Atalan, M. Dede, Ü. Çelik, A.Oral<br />

P.II-35 Enhancement <strong>of</strong> the Exchange-bias Effect based on Quantitative Magnetic <strong>Force</strong><br />

<strong>Microscopy</strong> Results<br />

N. Pilet, M.A. Marioni, S. Romer, N. Joshi, S. Özer, H.J. Hug<br />

27

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