Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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P.II-34 Sub-10 nm resolution in Magnetic Force Microscopy (MFM) at ambient conditions Ö. Karcı 1,2 , H. Atalan 1 , M. Dede 1 , Ü. Çelik 3 , A.Oral 4 1 NanoMagnetics Instruments Ltd., 266 Banbury Road, Oxford OX2 7DL, UK. 2 Hacettepe University, Department of Nanoscience & Nanomedicine, Beytepe, Ankara, Turkey 3 Istanbul Technical University, Department of Material Science, Istanbul, Turkey 4 Sabanci University, Faculty of Engineering & Natural Sciences, 34956 Istanbul, Turkey aoral@sabanciuniv.edu We describe designs of high resolution Magnetic Force Microscopes, which can achieve better than 10 nm resolution in magnetic imaging even in ambient conditions. We developed two different MFMs, which can both achieve better than 10 nm lateral resolution, using commercially available, off the shelf, magnetically coated cantilevers. Both MFMs have been optimized to have low noise, using RF modulation of the laser diode. One of the instruments is designed for low temperature use, 300 mK-300 K using low noise fiber optic interferometer & alignment free cantilevers. The other MFM is designed to operate in ambient conditions and employ a beam deflection pickup with optimized noise performance. Both MFMs can also be operated in bimodal operation, using first and second resonance of the magnetically coated cantilever for topography and magnetic contrast. One of the typical images obtained at ambient conditions with the MFMs on Seagate’s 394 Gbpsi harddisk is given below. 162
P.II-35 Enhancement of the Exchange-bias Effect based on Quantitative Magnetic Force Microscopy Results. N. Pilet 1 , M.A. Marioni 1 , S. Romer 1 , N. Joshi 2 , S. Özer 2 and H.J. Hug, 1,2 1 Empa, Swiss Federal Institute for Materials Testing and Research, CH-8600 Duebendorf, Switzerland, 2 Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland Exchange biasing (EB) causes a lateral shift of the magnetization vs. field curve in antiferromagnetic-ferromagnetic (AF-F) thin-film structures. It is largely believed that EB arises from linking the magnetization of the F to that of (pinned) uncompensated spins (UCS) in the AF. In the present work we are able to measure the local density of UCS on the scale of 20 nm, using quantitative magnetic force microscopy (qMFM). With quantitative results at this lateral resolution, it becomes possible to resolve and measure the UCS underneath each F domain at scales comparable to the grain size. The average density of UCS around 20% of that expected for a full monolayer of spins is considerably higher than expected from the measured exchange field and local values may reach 100%. We found that UCSs coupling antiparallel to the F magnetization stabilize its orientation, i.e. they are biasing [1,2]. Locally, UCS oriented parallel to the F magnetization were found. These have an antibiasing effect and are hence expected to weaken the exchange field. We hypothesized that such anti-biasing arises from conflicting exchange interaction between the F-layer and AF-grains, and between AFgrains themselves. Exchange-bias systems grown with suppressed inter-granular coupling in the AF-layer proved our hypothesis to be correct. These systems showed an exchangebias effect enhanced by 20%. High resolution MFM revealed a more homogenous pattern of UCS with a correspondingly higher density. The evolution of the F-domains in an applied field was strikingly different. Figure 1: . (A) UCS density calculated from measured MFM data and the instrument calibration function. Positive UCS (i.e. parallel to the cooling field) are colored yellow, negative UCS red. (B) UCS with overlayed contours of the F domains at H = 0; (C) Idem for H = 200mT. With few exceptions (such as pointed out by the arrows) the UCS align antiparallel to the domain magnetization at H=0. [1] I. Schmid, P. Kappenberger, O. Hellwig, M. Carey, E. Fullerton and H. J. Hug, EPL 81 (2008) 17001 [2] I. Schmid, M. Marioni et al. submitted. 163
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
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Tu-1530 The Effective Quality Facto
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We-0900 Imaging Single Atoms on Oxi
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We-0940 Character of the short-rang
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We-1020 Local surface photovoltage
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We-1140 Theoretical DFT simulations
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We-1220 Theoretical study of the fo
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Steering the formation of molecular
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Molecular scale dissipation in olig
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Dependence of the atomic scale imag
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Th-0940 Intramolecular features of
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Th-1020 Adhesion-induced energy dis
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Measuring Atomic Charge States by n
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Th-1220 Controlling electron transf
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Oral Presentations Friday, 14 Augus
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Small amplitude atomic resolution N
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Fr-1000 Visualization of Anisotropi
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Atomic resolution dynamic lateral f
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Bimodal AFM imaging of antibodies a
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Poster Session I Tuesday, 11 August
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P.I-02 Force Map of Atomic Force Mi
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P.I-04 Improved atomic-scale contra
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P.I-06 Resonance frequency shift du
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P.I-08 Atomic force microscope cant
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Self-assembled Boronitride Nanomesh
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P.I-12 Resolution enhanced multifre
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P.I-14 Kelvin Force Microscopy Dyna
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Open source scanning probe microsco
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P.I-18 Design of a Variable Tempera
Page 113 and 114: P.I-20 Besocke style quartz tuning
Page 115 and 116: P.I-22 A homebuilt low-temperature
Page 117 and 118: P.I-24 High-Speed Frequency Modulat
Page 119 and 120: P.I-26 Deciphering Nanoscale Intera
Page 121 and 122: Dual-Frequency-Modulation AFM Spect
Page 123 and 124: P.I-30 Internal Resonances and Spat
Page 125 and 126: Relation between lateral forces and
Page 127 and 128: M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130: Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144: Molecular Resolution Investigation
Page 145 and 146: Development of Multifrequency High-
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
Page 159 and 160: P.II-29 Local Dielectric Spectrosco
Page 161 and 162: P.II-31 Polarization-dependent elec
Page 163: Magnetic Resonance Force Microscopy
Page 167 and 168: Abe M. 51,58,92,141 Clerk A. A. 78
Page 169 and 170: Martinez N. F. 69 Parashar P. 31 Ma
Page 171 and 172: List of Participants 169
Page 173 and 174: Ido Shinichiro Kyoto University ido
Page 175 and 176: Wright Alan University of Maryland
Page 177 and 178: Ultra-high precision spatial positi
Page 179 and 180: AD VT-QPlus_ONUS / 09-May Nanotechn
Page 181: Surface Analysis Technology Aarhus
Page 184 and 185: Notes
Page 186: NC-AFM 2009 Sessions Monday August
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