Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Imaging the Future of Nanoscience World leading technology in UHV Scanning Probe Microscopes, SPM Control Systems, and Complete Surface Analysis Systems. RHK Technology sets the standard for powerful, flexible solutions for researchers pushing the limits of fundamental science at the atomic scale PLLPro 2 AFM Control System RHK’s next generation of AFM control. Ultra high performance and KFM capability in a one box solution. IDEAL INTERFACE IHDL TM RHK’s unique Iconic Hardware Description Language unites flexibility, function, and simplicity for ideal experimental configuration. Fast, intuitive “drag-and-drop” setup uses icons to represent hardware blocks. Simply connect icons to design the experiment. Devices automatically configure and connect when the template is implemented. PURPOSE BUILT HARDWARE ONE BOX INTEGRATION integrated surface science solutions Air-Cleaved Mica NC-AFM Large regularly shaped islands on air-cleaved mica surfaces after degassing in UHV at 473 K for 14 h. NC-AFM images recorded in constant detuning mode. F. Ostendorf, C. Schmitz, S. Hirth, A. Kuhnle, Kolodziej, M. Reichling Tuning Fork AFM on Silicon RHK UHV 325 with RHK SPM 1000 and PLLPro Controllers. True constant height image with current and ∆F(Hz) acquisition amplitude of oscillation, 3Å peak to peak. S. Pryadkin, RHK. RHK Technology, Inc. | 1050 East Maple, Troy, MI 48083 | 248.577.5426 | www.rhk-tech.com | Visit our booth at NC-AFM 2009
Surface Analysis Technology Aarhus STM State-of-the-Art STM Technology for Advanced SPM Research Key Features: � Quartz oscillator based design: sensor (tungsten tip) separated from oscillator: force and tunneling signals simultaneously and indepentently � Imaging of conductive and non-conductive samples in non-contact mode Vacuum Components � Atomically resolved imaging on a daily basis JT-STM Ultra-low temperature Joule Thomson-STM for ultimate STM spectroscopy and manipulation Key Features: � Designed at Aarhus University, group of Prof. F. Besenbacher � Extreme stability � Highest productivity � Variable temperature: 115 K to 400 K (for STM optional: 1300 K) � One-tip-suits-all: in situ tip sputtering Key Features: � Cryostat designed by Prof. W. Wulfhekel � Base temperature: < 1 K (optional < 500 mK) � LHe hold time: > 4 days � NANONIS control package � Magnetic field up to 3 Tesla Applications: Surface Analysis System Software AFM Option Combining KolibriSensor TM and NANONIS Control Package � Inelastic electron tunneling spectroscopy � Investigation of superconductors � Quantum structures � Spin polarized tunneling � Atomic manipulation � Molecular electronics Computer Technology
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
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Tu-1530 The Effective Quality Facto
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We-0900 Imaging Single Atoms on Oxi
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We-0940 Character of the short-rang
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We-1020 Local surface photovoltage
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We-1140 Theoretical DFT simulations
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We-1220 Theoretical study of the fo
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Steering the formation of molecular
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Molecular scale dissipation in olig
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Dependence of the atomic scale imag
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Th-0940 Intramolecular features of
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Th-1020 Adhesion-induced energy dis
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Measuring Atomic Charge States by n
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Th-1220 Controlling electron transf
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Oral Presentations Friday, 14 Augus
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Small amplitude atomic resolution N
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Fr-1000 Visualization of Anisotropi
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Atomic resolution dynamic lateral f
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Bimodal AFM imaging of antibodies a
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Poster Session I Tuesday, 11 August
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P.I-02 Force Map of Atomic Force Mi
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P.I-04 Improved atomic-scale contra
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P.I-06 Resonance frequency shift du
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P.I-08 Atomic force microscope cant
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Self-assembled Boronitride Nanomesh
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P.I-12 Resolution enhanced multifre
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P.I-14 Kelvin Force Microscopy Dyna
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Open source scanning probe microsco
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P.I-18 Design of a Variable Tempera
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P.I-20 Besocke style quartz tuning
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P.I-22 A homebuilt low-temperature
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P.I-24 High-Speed Frequency Modulat
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P.I-26 Deciphering Nanoscale Intera
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Dual-Frequency-Modulation AFM Spect
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P.I-30 Internal Resonances and Spat
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Relation between lateral forces and
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M. Teresa Cuberes Ultrasonic Nanoli
Page 129 and 130: Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144: Molecular Resolution Investigation
Page 145 and 146: Development of Multifrequency High-
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
Page 159 and 160: P.II-29 Local Dielectric Spectrosco
Page 161 and 162: P.II-31 Polarization-dependent elec
Page 163 and 164: Magnetic Resonance Force Microscopy
Page 165 and 166: P.II-35 Enhancement of the Exchange
Page 167 and 168: Abe M. 51,58,92,141 Clerk A. A. 78
Page 169 and 170: Martinez N. F. 69 Parashar P. 31 Ma
Page 171 and 172: List of Participants 169
Page 173 and 174: Ido Shinichiro Kyoto University ido
Page 175 and 176: Wright Alan University of Maryland
Page 177 and 178: Ultra-high precision spatial positi
Page 179: AD VT-QPlus_ONUS / 09-May Nanotechn
Page 184 and 185: Notes
Page 186: NC-AFM 2009 Sessions Monday August
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