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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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<strong>Noncontact</strong> <strong>Atomic</strong> <strong>Force</strong> Microscope Observation<br />

<strong>of</strong> TiO2(110) Surface in Pure Water<br />

Akira Sasahara 1 , Yonkil Jeong 1 , and Masahiko Tomitori 1<br />

1 <strong>School</strong> <strong>of</strong> Materials Science, Japan Advanced Institute <strong>of</strong> Science and Technology, Ishikawa, Japan<br />

P.II-14<br />

Titanum dioxide (TiO2) has a wide range <strong>of</strong> industrial applications such as pigments,<br />

optical devices, catalyst supports, photocatalysts, and photoelectrodes. A rutile<br />

TiO2(110) surface, which exhibits a simple truncation <strong>of</strong> the bulk structure (Fig. 1(a)) by<br />

simple cleaning procedures, has been most frequently employed in ultra high vacuum<br />

(UHV) studies to understand the origin <strong>of</strong> its properties. In many <strong>of</strong> the applications,<br />

TiO2 demonstrates the excellent properties in the presence <strong>of</strong> aqueous media. Nanoscale<br />

investigation <strong>of</strong> a well-defined rutile TiO2(110) surface in a liquid possibly provides<br />

further insight into the surface chemical properties <strong>of</strong> TiO2. We attempted noncontact<br />

atomic force microscope (NC-AFM) observation <strong>of</strong> TiO2(110) surface in pure water.<br />

The experiments were performed by using an intermittent contact mode atomic force<br />

microscope (5500 AFM/SPM, Agilent Technologies). The microscope was operated as<br />

an NC-AFM by using a phase locked loop detector (easy PLL plus, Nanosurf AG). The<br />

microscope was placed in a glass chamber, and imaging was performed under a flow <strong>of</strong><br />

Ar. The TiO2(110) surface was cleaned by cycles <strong>of</strong> Ar + sputtering and annealing in<br />

UHV, removed from the vacuum chamber, and immersed in Ar-purged Milli-Q water.<br />

Figure 1(b) shows an NC-AFM image <strong>of</strong> the surface in water. Strings elongated to the<br />

[001] direction were observed. Along cross section 1 in Fig. 1(c), subnanometer<br />

corrugation was observed perpendicular to the rows. The distance between the lowest<br />

rows, indicated by arrowheads, was approximately 0.65 nm. On some <strong>of</strong> the rows,<br />

periodic corrugation was observed as shown in the cross sections 2 and 3. We attributed<br />

the lowest rows to the oxygen atom rows, and the corrugation along the rows to H2O<br />

clusters.<br />

Figure 1: (a) Ball model <strong>of</strong> a rutile TiO2(110)-(1×1) surface. Size <strong>of</strong> the unit cell is 0.65<br />

nm×0.30 nm. (b) NC-AFM image <strong>of</strong> the TiO2(110) surface in pure water (15×15 nm 2 ).<br />

Frequency shift = +150 Hz, sample bias voltage = 0 V, peak-to-peak amplitude <strong>of</strong> the cantilever<br />

oscillation = 2 nm. (c) Cross sections obtained along the lines in the image.<br />

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