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Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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Atom-resolved AFM studies <strong>of</strong> the polar MgAl2O4 (001) surface<br />

Morten K. Rasmussen, Jeppe V. Lauritsen, and Flemming Besenbacher<br />

Interdisciplinary Nanoscience Center (iNANO), University <strong>of</strong> Aarhus, Denmark<br />

P.II-24<br />

Magnesium-aluminate spinel (MgAl2O4) has many interesting properties and<br />

applications, among other things the use as a support for catalysts. In particular, MgAl2O4<br />

in a porous form is a support material for the important Ni-based catalyst used for steam<br />

reforming <strong>of</strong> methane, which today is the most common method <strong>of</strong> producing bulk<br />

hydrogen. A study <strong>of</strong> the clean spinel is thus <strong>of</strong> very great importance to understand the<br />

role <strong>of</strong> the support, and still almost no surface science studies on the MgAl2O4 surface<br />

have been presented due to the insulating nature <strong>of</strong> the material. When constructing a<br />

surface model one must consider the fact that the spinel (001) surface is polar and the<br />

surface consequently has to be modified somehow to cancel out or compensate for this.<br />

Additionally, it is well known that the AFM tip can pick up material from the surface,<br />

and this material then can change the polarity <strong>of</strong> the nano-apex which leads to variations<br />

in the AFM contrast seen in atom-resolved images and reveals the individual sub lattices<br />

[1, 2]. In this study we observe from atom-resolved AFM images that the MgAl2O4 (001)<br />

surface may be imaged in two distinctly different contrast modes revealing the anion or<br />

cation sub-lattice. Tentative structural characterizations from the AFM studies suggest a<br />

stoichiometric bulk like termination. Stabilization mechanism may then include<br />

relaxations in the crystal structure below the topmost layer which cannot be probed by<br />

AFM, hence surface x-ray diffraction is used to complement the AFM data.<br />

a) b)<br />

Figure 1: (a) Atom resolved non-contact AFM image (4nm×4nm) <strong>of</strong> the clean MgAl2O4 (001)<br />

surface imaged under UHV conditions together with (b) a ball model <strong>of</strong> the surface. The surface<br />

appears to be Mg-terminated and near stoichiometric with a low atomic defect density less than<br />

0.1ML.<br />

[1] Lauritsen, J.V., et al., Chemical identification <strong>of</strong> point defects and adsorbates on a metal oxide<br />

surface by atomic force microscopy. Nanotechnology, 2006. 17(14): p. 3436.<br />

[2] Enevoldsen, G.H., et al., <strong>Noncontact</strong> atomic force microscopy studies <strong>of</strong> vacancies and hydroxyls<br />

<strong>of</strong> TiO[sub 2](110): Experiments and atomistic simulations. Physical Review B (Condensed<br />

Matter and Materials Physics), 2007. 76(20): p. 205415-14.<br />

152

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