Noncontact Atomic Force Microscopy - Yale School of Engineering ...

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First Announcement: 13th International Conference on Noncontact Atomic Force Microscopy Kanazawa, Japan 13th International Conference on Noncontact Atomic Force Microscopy (ncAFM2010) and Satellite Workshops on bio-imaging, solid-liquid interface, SPM standardization Venue: Ishikawa Ongakudo, Kanazawa, JAPAN Date: July 31 - August 1, 2010 (Satellite Workshops) August 2 - 5, 2010 (ncAFM2010) Conference Chair: Toyoko Arai (Kanazawa Univ.) Program committee: Masayuki Abe (Osaka Univ.) Proceedings committee: Satoshi Watanabe (Univ. of Tokyo) Web page: http://www.afm.eei.eng.osaka-u.ac.jp/ncafm2010/ Kanazawa information: http://www.kanazawa-tourism.com/ Co-organizers (tentative): 167th Committee on Nano-Probe Technology of JSPS The Surface Science Society of Japan Osaka University Global Center of Excellence Program Center for Electronic Device Innovation
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12 th International Conference on N
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Welcome Dear conference participant
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Topics • Atomic resolution imagin
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Committees Program Committee Jaime
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General Information (cont.) Oral Pr
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Exhibitors 9
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Proceedings (cont.) 3. Length: Pape
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Conference Program 13
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Program Summary of the NC-AFM 2009
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Monday, August 10 Satellite Worksho
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Wednesday, August 12 Oxides Chair:
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Friday, August 14 Method Developmen
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Poster Session I cont. (Tuesday) In
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POSTER Session II (Wednesday) Molec
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Poster Session II cont. (Wednesday)
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Non-retarded and retarded interacti
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Mo-0955 Multiple Scattering Casimir
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Diego Dalvit 1 Dispersive Casimir i
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Using Casimir and capillary forces
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Near-field radiative heat transfer
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Mo-1615 Tricks and facts in a high
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Measuring the topological dependenc
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Mo-1755 Contact potential differenc
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3D Scanning Force Microscopy at Sol
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Tu-1000 Experimental and Theoretica
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Dynamic Force Spectroscopy of Singl
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Simultaneous measurement of force a
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Water, Ions, Membranes, Real Metals
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Tu-1530 The Effective Quality Facto
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We-0900 Imaging Single Atoms on Oxi
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We-0940 Character of the short-rang
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We-1020 Local surface photovoltage
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We-1140 Theoretical DFT simulations
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We-1220 Theoretical study of the fo
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Steering the formation of molecular
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Molecular scale dissipation in olig
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Dependence of the atomic scale imag
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Th-0940 Intramolecular features of
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Th-1020 Adhesion-induced energy dis
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Measuring Atomic Charge States by n
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Th-1220 Controlling electron transf
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Oral Presentations Friday, 14 Augus
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Small amplitude atomic resolution N
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Fr-1000 Visualization of Anisotropi
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Atomic resolution dynamic lateral f
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Bimodal AFM imaging of antibodies a
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Poster Session I Tuesday, 11 August
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P.I-02 Force Map of Atomic Force Mi
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P.I-04 Improved atomic-scale contra
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P.I-06 Resonance frequency shift du
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P.I-08 Atomic force microscope cant
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Self-assembled Boronitride Nanomesh
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P.I-12 Resolution enhanced multifre
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P.I-14 Kelvin Force Microscopy Dyna
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Open source scanning probe microsco
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P.I-18 Design of a Variable Tempera
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P.I-20 Besocke style quartz tuning
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P.I-22 A homebuilt low-temperature
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P.I-24 High-Speed Frequency Modulat
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P.I-26 Deciphering Nanoscale Intera
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Dual-Frequency-Modulation AFM Spect
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P.I-30 Internal Resonances and Spat
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Relation between lateral forces and
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M. Teresa Cuberes Ultrasonic Nanoli
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Contacting self-ordered molecular w
Page 131 and 132: Molecular Structures of Organic Sin
Page 133 and 134: One and Two Dimensional Structure o
Page 135 and 136: Temperature-dependent growth of C60
Page 137 and 138: P.II-07 Atomic Force Microscopy Stu
Page 139 and 140: Imaging and Detection of Single Mol
Page 141 and 142: P.II-11 Imaging Schwann Cell NGF Re
Page 143 and 144: Molecular Resolution Investigation
Page 145 and 146: Development of Multifrequency High-
Page 147 and 148: Noncontact observation in liquid wi
Page 149 and 150: P.II-19 Cantilever Holder Design fo
Page 151 and 152: P.II-21 Manipulation Mechanism of S
Page 153 and 154: nc-AFM Investigations of Metal Nano
Page 155 and 156: P.II-25 Contrast formation on cross
Page 157 and 158: P.II-27 Non-contact scanning nonlin
Page 159 and 160: P.II-29 Local Dielectric Spectrosco
Page 161 and 162: P.II-31 Polarization-dependent elec
Page 163 and 164: Magnetic Resonance Force Microscopy
Page 165 and 166: P.II-35 Enhancement of the Exchange
Page 167 and 168: Abe M. 51,58,92,141 Clerk A. A. 78
Page 169 and 170: Martinez N. F. 69 Parashar P. 31 Ma
Page 171 and 172: List of Participants 169
Page 173 and 174: Ido Shinichiro Kyoto University ido
Page 175 and 176: Wright Alan University of Maryland
Page 177 and 178: Ultra-high precision spatial positi
Page 179 and 180: AD VT-QPlus_ONUS / 09-May Nanotechn
Page 181: Surface Analysis Technology Aarhus
Page 185 and 186: Program Summary of the NC-AFM 2009
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