Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
Noncontact Atomic Force Microscopy - Yale School of Engineering ...
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3D Scanning <strong>Force</strong> <strong>Microscopy</strong> at Solid/Liquid Interface<br />
Takeshi Fukuma 1,2 and Yasumasa Ueda 1<br />
1 Frontier Science Organization, Kanazawa University, Kanazawa, Japan<br />
2 PRESTO, Japan Science and Technology Agency, Kawaguchi, Japan.<br />
Tu-0920<br />
The solid/liquid interface inherently has a three-dimensional (3D) extent in XYZ<br />
directions. This is particularly evident when solvation layers exist at the interface [1]. In<br />
frequency modulation atomic force microscopy (FM-AFM), a tip is scanned in XY<br />
directions to produce a 2D height (or Δf ) image having no vertical extent in Z direction.<br />
Therefore, the information contained in a 2D FM-AFM image is insufficient for<br />
understanding 3D distribution <strong>of</strong> solvent molecules interacting with the atoms or<br />
molecules constituting the solid surface. In an effort to resolve this issue, 3D force<br />
mapping technique has been proposed, where a number <strong>of</strong> force curves are measured at<br />
arrayed XY positions. This, however, results in a considerable increase <strong>of</strong> imaging time<br />
and hence has been used mainly in vacuum at low temperatures.<br />
In this study, we propose a method referred to as “3D scanning force microscopy (3D-<br />
SFM)”, where a tip is scanned in Z as well as XY directions. While 3D force mapping is<br />
based on 1D force spectroscopy, 3D-SFM is based on 2D imaging technique. This<br />
methodological advancement, together with our recent development <strong>of</strong> high-speed<br />
scanner and frequency detector, has enabled us to obtain 3D-SFM image <strong>of</strong> mica/water<br />
interface in 53 sec (Fig. 1). The atomically-resolved XY and XZ cross-sectional images<br />
obtained from the 3D-SFM image allow us to correlate the lateral positions <strong>of</strong> the surface<br />
atoms with the vertical distribution <strong>of</strong> the force field. The site-specific Δf vs distance<br />
curves are obtained from the Z pr<strong>of</strong>iles <strong>of</strong> the 3D-SFM image, revealing the remarkable<br />
variation <strong>of</strong> the force pr<strong>of</strong>iles depending on the tip positions. The results demonstrate that<br />
3D-SFM provides diverse information that has not been accessible with conventional 2D<br />
imaging techniques.<br />
Figure 1: (a) XY and XZ cross-sectional images and (b) Δf vs distance curves obtained from a<br />
3D-SFM image <strong>of</strong> mica/water interface (53 sec / 3D image, 0.82 sec / XZ image, Raw data).<br />
[1] T. Fukuma, M. J. Higgins and S. P. Jarvis, Biophys. J. 92 (2007) 3603-3609.<br />
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