TH ESE Mohamed H edi TOUATI TEST ET ... - Laboratoire TIMA

| Bibliographie |
[RiB85] J. Richmann and K. R. Bowden, "The Modern Fault Dictionary", International
Test Conference, 1985, pp. 696-702.
[RoD90] G. D Robinson and J. G Deshayes, "Interconnect Testing of Boards with
Partial Boundary Scan",International Test Conference, 1990, pp. 572-581.
[Rob83] G. D. Robinson, "HITEST-Intelligent Test Generation", International Test
Conference' 1983, pp. 311-323.
[ShL91] Q.shen & R.Leitch; "Diagnosing Continuos Dynamic Systems Using Qualitative
Simulation", Proc. of the Fifth National Conf. on Control, 1991.
[SzY93] Z. Shen, R.R.Yager, S. Ovchinnkov, R.M Tong and H.T. Nguyen; "Fuzzy Sets
and Their Applications": Selected Papers by L.A.Zadeh, Articial Intelligence
Vol 61, pp. 351-358, 1993.
[TFH92] M. V. Tegetho, T. E. Figal et S. W. Hird, "Board Test DFT Model for
Computer Products", International Test Conference, 1992, pp. 367-371.
[TI89] Texas Instruments Inc., "Product Preview, SN54BCT8244, SN74BCT8244
Scan Test Device with Octal Buer", 1989.
[TMM96] M. H. Touati, F. Mohamed and M. Marzouki, "System Fault Diagnosis
based on a Fuzzy-Qualitative Approach", European Design and Test Conference,
Paris, France, Mars 1996.
[Tou92] M. H. Touati, "Implantation et Validation de la methode de Simplication de
Graphe sur les Benchmarks Sequentiels", Rapport de DEA, LIRMM-Universite
de Montpellier II, Juillet 1992.
[TuY89] R. E. Tullos and C. W. Yau, "Test program pseudocode", European Test
Conference, Paris, 1989, pp. 106-111.
[Ved94] Veda Design Automation, "System Hilo 4, user manual", 1994.
[WaL89] J. A. Waicukauski and E. Lindbloom, "Failure Diagnosis on Structured
VLSI", IEEE Design and Test of Computers, 1989, pp. 49-60.
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