| Bibliographie | [RiB85] J. Richmann and K. R. Bowden, "The Modern Fault Dictionary", International Test Conference, 1985, pp. 696-702. [RoD90] G. D Robinson and J. G Deshayes, "Interconnect Testing of Boards with Partial Boundary Scan",International Test Conference, 1990, pp. 572-581. [Rob83] G. D. Robinson, "HI<strong>TEST</strong>-Intelligent Test Generation", International Test Conference' 1983, pp. 311-323. [ShL91] Q.shen & R.Leitch; "Diagnosing Continuos Dynamic Systems Using Qualitative Simulation", Proc. of the Fifth National Conf. on Control, 1991. [SzY93] Z. Shen, R.R.Yager, S. Ovchinnkov, R.M Tong and H.T. Nguyen; "Fuzzy Sets and Their Applications": Selected Papers by L.A.Zadeh, Articial Intelligence Vol 61, pp. 351-358, 1993. [TFH92] M. V. Tegetho, T. E. Figal et S. W. Hird, "Board Test DFT Model for Computer Products", International Test Conference, 1992, pp. 367-371. [TI89] Texas Instruments Inc., "Product Preview, SN54BCT8244, SN74BCT8244 Scan Test Device with Octal Buer", 1989. [TMM96] M. H. Touati, F. <strong>Mohamed</strong> and M. Marzouki, "System Fault Diagnosis based on a Fuzzy-Qualitative Approach", European Design and Test Conference, Paris, France, Mars 1996. [Tou92] M. H. Touati, "Implantation et Validation de la methode de Simplication de Graphe sur les Benchmarks Sequentiels", Rapport de DEA, LIRMM-Universite de Montpellier II, Juillet 1992. [TuY89] R. E. Tullos and C. W. Yau, "Test program pseudocode", European Test Conference, Paris, 1989, pp. 106-111. [Ved94] Veda Design Automation, "System Hilo 4, user manual", 1994. [WaL89] J. A. Waicukauski and E. Lindbloom, "Failure Diagnosis on Structured VLSI", IEEE Design and Test of Computers, 1989, pp. 49-60. { 129 {
| Bibliographie | [Wag87] P. Wagner, "Interconnect Testing with Boundary Scan", International Test Conference, 1987, pp. 52-57. [Woo91] O. C. Woodward Sr, "Voltage Contrast Electron Beam Tester for Testing Unpopulated MCMs", Hybrid Circuit Technology, February 1991, pp. 20-27. [XiS86] Z. Xiang et S. N. Srihari, "A Strategy for diagnosis based on empirical and model knowledge", journees des systemes experts, Avignon (France), pages 835- 848, 1986. [Zad65] L. A. Zadeh, "Fuzzy Sets", Information and Control, pp. 338-353, 1965. [Zor92] Y. Zorian, "A Universal Testability Strategy for Multi-Chip Modules Based on BIST and Boundary Scan", International Conference on Computer Design, 1992, pp. 59-66. [Zor95] Y. Zorian, "Design and Test of MCMs", European Design and Test Conference, TUTORIAL #D, Paris 1995. { 130 {