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TH ESE Mohamed H edi TOUATI TEST ET ... - Laboratoire TIMA

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| Bibliographie |<br />

[Wag87] P. Wagner, "Interconnect Testing with Boundary Scan", International Test<br />

Conference, 1987, pp. 52-57.<br />

[Woo91] O. C. Woodward Sr, "Voltage Contrast Electron Beam Tester for Testing<br />

Unpopulated MCMs", Hybrid Circuit Technology, February 1991, pp. 20-27.<br />

[XiS86] Z. Xiang et S. N. Srihari, "A Strategy for diagnosis based on empirical and<br />

model knowledge", journees des systemes experts, Avignon (France), pages 835-<br />

848, 1986.<br />

[Zad65] L. A. Zadeh, "Fuzzy Sets", Information and Control, pp. 338-353, 1965.<br />

[Zor92] Y. Zorian, "A Universal Testability Strategy for Multi-Chip Modules Based<br />

on BIST and Boundary Scan", International Conference on Computer Design,<br />

1992, pp. 59-66.<br />

[Zor95] Y. Zorian, "Design and Test of MCMs", European Design and Test Conference,<br />

TUTORIAL #D, Paris 1995.<br />

{ 130 {

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