Materials for engineering, 3rd Edition - (Malestrom)

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Structure of engineering materials 11 1.6 Macrostructure of a cast metal. Large equiaxed grains have formed at the centre of the ingot. (Courtesy Dr P. A. Withey.) is too fine to be discerned without the use of a microscope and specimen preparation is much more critical than for macro-examination. Polishing to a mirror finish is necessary, usually by holding the specimen against a horizontal rotating wheel covered with a short-pile cloth fed with a suspension or cream of a polishing agent. The latter can be magnesium oxide or aluminium oxide powder, although diamond pastes (of micrometre particle size) are commonly used. In the case of electrically conducting specimens such as metals, the final finish is often achieved by electrolytic polishing, where the specimen is made the anode in a suitable electrolyte. If the current density is correct, a bright scratch-free surface can be produced. A much lighter etching treatment is applied for microscopical examination than for macro-studies. With some etching reagents and very short etching times, metal is dissolved only at the grain boundaries, giving rise to shallow grooves there, which are seen as a network of dark lines under the microscope. A reflecting optical microscope may give magnifications of over 1000 ×, with a resolution of about 1 µm. The upper limit of magnification of the optical microscope is often inadequate to resolve structural features which are important in engineering materials, however, and electron microscopy is widely employed for this purpose. Field-ion microscopy is a research tool with a resolving power that permits the resolution of the individual atoms in crystals and these can be identified by use of the atom-probe technique. The two most commonly employed techniques of electron microscopy (EM) are scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
12 Materials for engineering SEM A schematic diagram of a SEM instrument is given in Fig. 1.7. The beam produced by the electron gun is condensed and demagnified by the electromagnetic lenses to produce a ‘probe’ which is scanned over the surface of the sample. Electrons emitted from the specimen surface are collected and amplified to form a video signal for a cathode-ray tube display. Typical resolutions of 10 nm may be obtained, with a depth of focus of several millimetres. It is this combination of high resolution with a large depth of focus that makes SEM well suited for examining fracture surfaces. Accelerating potential and filament current Lens I current Lens 2 current Scan generator Lens 3 current Specimen chamber Mag. control Photomultiplier Scan amplifier Vacuum pumps Video amplifier Visual Displays Photo 1.7 Schematic diagram of a scanning electron microscope.
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Page 7 and 8: vi Contents 3.4 Degradation of meta
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Page 17 and 18: xvi Introduction Young’s modulus,
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Part II Structure-property relation
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Part III Problems
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Appendix I Useful constants Symbol
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234 Appendix II Fracture toughness
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Appendix IV Sources of material pro
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Sources of material property data 2
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Index acrylics 160 adhesives 121 ad
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Index 245 smart fibre 189 stiffness
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Index 247 GPC (gel permeation chrom
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Index 249 offset yield strength 39
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Index 251 nitriding 83-4 normalisin
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Materials for engineering, 3rd Edition - (Malestrom)

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