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NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

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Keyer. D. C., A test set for the accurate meAsurements IHnkler, C. K. R.• Ilall, lL C.• <strong>and</strong> Percival, D. a., The<strong>of</strong> phAse noise on high-quality aignal sources.U.S. Naval Ob.arvatory clock time raCarence <strong>and</strong> theIEEl Trans. lnatr. <strong>and</strong> ne.s., Vol. ~, 215-227. p.rfomance oC a samp1a <strong>of</strong> atolaie eloelu. Ketro­(Nov 1970). 10gia, Vol. ~, 126-134, (Oct 1970).Percival. O. 8 .• A heuristic model <strong>of</strong> long-term atomic Yoshimura, K., <strong>Characterization</strong> <strong>of</strong> fraquancy atability:clock behavior. Proc. 30th Annual Symposium on Uncertainty due to the autocorr.lation <strong>of</strong> tha fre­Frequency Control, (June 1976).quency fluctuations. IEEE Trans. Instr. <strong>and</strong> Keas.,1&.21. 1-7. (MAr 1978).Ricci, O. W.• <strong>and</strong> Peregrina. L., Phase noise measurementusing a high resolution counter with on-line dataprocessing. Proc. 30th Annual Symposium onFrequency Control, (June 1976).The authors are wembers <strong>of</strong> the <strong>Technical</strong> Committee TC-).Time <strong>and</strong> Frequency. <strong>of</strong> the IEEE Instrumentation <strong>and</strong>Rutman. J., Comment on characterization <strong>of</strong> frequency MeAsurement Society. This paper is part <strong>of</strong> this Commitstability.IEEE Trans. lostr. <strong>and</strong> Meas., Vol. ~ tee's effort to develop an IEEE St<strong>and</strong>ard. To this end.ll, 85, (Feb 1972).the IEEE authorized a St<strong>and</strong>ards Coordinating Committee.sec 21. <strong>and</strong> the development <strong>of</strong> the IEEE St<strong>and</strong>ard underRutman. J .. <strong>Characterization</strong> <strong>of</strong> frequency stability: A PAR-P·l139. sec 21 is formed out <strong>of</strong> the 16M. UFFC <strong>and</strong>transfer function approach <strong>and</strong> its application to KTT Societies; tha authors are also members <strong>of</strong> sec 21.measurements via filtering <strong>of</strong> phase noise. IEEETrans. llUtr. <strong>and</strong> Meas., Vol. I.I1.:21.. 40-48. (Mar1974) .Rutman, J., <strong>Characterization</strong> <strong>of</strong> phase <strong>and</strong> frequencyinstabilities in precision frequency sources:Fifteen years <strong>of</strong> progress. Proc. IEEE. Vol. ~.1048-1075, (Sept 1978).Rutman, J., <strong>and</strong> Sauvage, C., Heasurement <strong>of</strong> frequencystability in the time <strong>and</strong> frequency domatns viafiltering <strong>of</strong> phAse noise. IEEE Trans. Instr. <strong>and</strong>Heas .• Vol. ~, 515-518. (Dec 1974).Rutman, J., <strong>and</strong> Uebersfeld, J., A model for flickerfrequency noise <strong>of</strong> oscillators. Proc. IEEE, Vol.iQ., 233-235, (Feb 1972).Sauvage. C., <strong>and</strong> Rutman, J., Analyse spectrale du bruitde frequence des oscillateurs par la variance deHadamard. Ann. des Telecom .• Vol. 1!. 304-314.(July-Aug 1973).Vanier. J., <strong>and</strong> Tetu, H., Time domain measurement <strong>of</strong>frequency stability: A tutorial approach, Proc.10th Annual Precise Time <strong>and</strong> Time Inteeval PlanningHeeting, 247-291, (1978).Vessot, R., Frequency <strong>and</strong> Time St<strong>and</strong>ards. Methods <strong>of</strong>Experimental Physics, Academic Press, New York,198-227, (1976).Vessot, R., Mueller, L., <strong>and</strong> Vanier. J., The specifica.ion<strong>of</strong> OScillator characteristics from measurementsmade in the frequency domain. Proe. IEEE,Vol. ~, 199-207 (Feb 1955).Von Neumann, J., Kent, R. H., Bellinson. H. R., <strong>and</strong>Ha:t, B. 1., The mean square successive difference,Ann. ~ch. Stat.• Vol. 11, 153-162, (1941).Walls. F.L., <strong>and</strong> Allan, D.W., Heasurements <strong>of</strong> FrequencyStability, Proc. IEEE, Special Issue on Radio Measurements<strong>and</strong> St<strong>and</strong>ards, Vol. ~, No.1, pp. 162­168 (Jan 1986).Walls, F. L., Stein, S. R.. Gray. J. E.. <strong>and</strong> Glaze,D. J., Design considerations In state-<strong>of</strong>-the-artsignal processing <strong>and</strong> phase noise measurementsvstems. Proc. 30th Annual Symposium on FrequencyC~ntrol, (June 1976).Winkler, G. M. R., A brief review <strong>of</strong> frequency stabilitymeasures. Proe. 8th Annual Precise Ttme <strong>and</strong> TimeInterval Planning Meeting, 489-528, U.S. Navala.~ ••~eh LabQr.co~, waShington, D.C .. (Dec 1976).425 IN-145

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