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NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

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12 FREQUENCY AND TIME MEASUREMENT197wherex(r) = ¢(r)/2rrvo (12-10)is the phase expressed in units <strong>of</strong> time. Alternatively, the phase could bewritten as the integral <strong>of</strong> the frequency <strong>of</strong> the oscillator:¢(r) = ¢o + {2ir[V(e) - vo] de. (12-11)However, the integral <strong>of</strong> a stationary process is generally not stationary.Thus, indiscriminate use <strong>of</strong> Eqs. (12-7) <strong>and</strong> (12-11) may violate the assumptions<strong>of</strong> the statistical model. This contradiction is avoided when oneaccounts for the finite b<strong>and</strong>width <strong>of</strong> the measurement process. Although amore detailed consideration <strong>of</strong> the statistics goes beyond the scope <strong>of</strong> thistreatment, it is very important to keep in mind the assumption that lie behindthe statistical analysis <strong>of</strong> oscillators. In order to analyze the behavior <strong>of</strong> realoscillators, it is necessary to adopt a model <strong>of</strong> their performance. The modelmust be consistent with observations <strong>of</strong> the device being simulated. To makeit easier to estimate the device parameters, the models usually include certainpredictable features <strong>of</strong> the oscillator performance, such as a linear frequencydrift. A statistical analysis is useful in estimating such parameters to removetheir effect from the data. It is just these procedures for estimating thedeterministic model parameters that have proved to be the most intractable.A substantial fraction <strong>of</strong> the total noise power <strong>of</strong>ten occurs at Fourierfrequencies whose periods are <strong>of</strong> the same order as the data length or longer.Thus, the process <strong>of</strong> estimating parameters may bias the noise residuals byreducing the noise power at low Fourier frequencies. A general technique forminimizing this problem in the case <strong>of</strong> oscillators actually observed in thelaboratory is discussed below.It has been suggested that measurement techniques for frequency <strong>and</strong> timeconstitute a hierarchy (Allan <strong>and</strong> Daams, 1975), with the measurement <strong>of</strong> thetotal phase <strong>of</strong> the oscillator at the peak. Although more difficult to measurewith high precision than other quantities, the total phase has this statusowing to the fact that all other quantities can be derived from it.Furthermore, missing measurements produce the least deleterious effect on atime series consisting <strong>of</strong> samples <strong>of</strong> the total phase. Gaps in the data affect thecomputation <strong>of</strong> various time-dependent quantities for times equal to orshorter than the gap length, but have a negligible effect for times much longerthan the gap length. The lower levels <strong>of</strong> the hierarchy consist <strong>of</strong> the timeinterval, frequency. <strong>and</strong> frequency fluctuation. When one measures a quantitysomewhere in this hierarchy <strong>and</strong> wishes to obtain a higher quantity, it isnecessary to integrate one or more times. In this case the problem <strong>of</strong> missingdata is quite serious. For example, if frequency is measured <strong>and</strong> one wants to1N-67

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