NIST Technical Note 1337: Characterization of Clocks and Oscillators
NIST Technical Note 1337: Characterization of Clocks and Oscillators
NIST Technical Note 1337: Characterization of Clocks and Oscillators
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BL-\5ES .-\.\D \·A.Rl.-\.\CES OF SEVERAL FFT SPECTRAL ESTI~.LHORSAS A FC='iCTION OF :-WISE TYPE A~D ~t:~1BER OF SA.\IPLESF. 1. Walls. Time <strong>and</strong> Frequency Division.:-lational Institute <strong>of</strong> St<strong>and</strong>ards <strong>and</strong> Technology, Boulder. CO 80303D. B. Percival, Applied Physics Laboratory,t.;'niversity <strong>of</strong> Washington, Seattle, WA 98106 From: Proceedings <strong>of</strong> theW. R. Irelan, Irelan Electronics. 43rd Annual Symposium on412 Janet, Tahlequah, OK 74464 Frequency Control, 1989.AbstractWe theoretically <strong>and</strong> experimentally investigate the biases<strong>and</strong> the variances <strong>of</strong> Fast Fourier transform (FFT) spectral estimateswith different windows (data tapers) when used to analyzepower·law noise types JO, 1- 1 , 1- 3 <strong>and</strong> 1- 4 . There is awide body <strong>of</strong> literature for white noise but virtually no investigation<strong>of</strong> biases <strong>and</strong> variances <strong>of</strong> spectral estimates for power-lawnoise spectra commonly seen in oscillators. amplifiers, mixers,etc. Biases (errors) in some cases exceed 3{) dB. The experimentaltechniques introduced here permit one to lUlalyze theperformance <strong>of</strong> virtually any window for any power-law noise.This makes it possible to determine the level <strong>of</strong> a particularnoise type to a specified statistical accuracy for a particularwindow.I. IntroductionFast Fourier transform (FFT) spectrum analyzers are verycommonly used to estimate the spectral density <strong>of</strong> noise. Theseinstruments <strong>of</strong>ten have several different windows (data tapers)available for analyzing different types <strong>of</strong> spectra. For example,in some applications spectral resolution is important; in others,the precise amplitude <strong>of</strong> a widely resolved line is important; <strong>and</strong>in still other applications, noise analysis is important. Thesediverse applications require different types <strong>of</strong> windows.We theoretically <strong>and</strong> experimentally investigate the biases<strong>and</strong> variances <strong>of</strong> FIT spectral estimates with different windowswhen used to analyze a number <strong>of</strong> common power-law noisetypes. There is a wide body <strong>of</strong> literature for white noise but virtuallyno investigation <strong>of</strong> these effects for the types <strong>of</strong> power-lawnoise spectra commonly seen in oscillators, amplifiers, mixers,etc. Speci£cally, we pTe3ent theoretical results for the biasesassociated with two common windows - the uniform <strong>and</strong> HIUlningwindows - when applied to power-law spectra varyingas 1 0 , 1- 1 <strong>and</strong> 1- 4 . We then introduce experimental techniquesfor accurately determining the biases <strong>of</strong> lUly window <strong>and</strong>use them to evaluate the biases <strong>of</strong> three different windows forpower-law spectra varying as r, 1- 1 , 1- 3 IUld 1- 4 • As an examplewe £nd with I-~ noise thAt the uniform window CIUl haveerrors ranging from a few dB to over 30 dB, depending on thelength <strong>of</strong> span <strong>of</strong> the f-t noise.We have also theoreticalJy investigated the varilUlces <strong>of</strong>FFT spectral estimates with the uniform IUld Hanning windows(confidence <strong>of</strong> the estimates) as a function <strong>of</strong> the power-lawnoise type <strong>and</strong> as a function <strong>of</strong> the amount c:i data. We introduceexperimental techniques thAt lIlAke it relatively easy toindependently determine the variance <strong>of</strong> the spectral estimatefor virtually lUly window on any FFT spectrum analyzer. Thevariance that is realized on a particular instrument depends notonly on the window but on the specific implementation in bothhardware <strong>and</strong> s<strong>of</strong>tware. We find that the variance c:i the spectraldensity estimates for white Doise, r, is very similar forthree specific windows available on one instrument <strong>and</strong> almostidentical to that obtained by st<strong>and</strong>ard statistical analysis. Thevariances for spectral density estimates <strong>of</strong> 1- 4 noise are only4% higher than that <strong>of</strong> 1° noise for two <strong>of</strong> the windows studied.The third window - the uniform window - does Dot vieldusable results for either 1- 3 or 1- 4 noise. Based on this work it is now possible to determine theminimum number <strong>of</strong> samples necessary to determine the level<strong>of</strong> a particular noise type to a specified statistical accuracy as afunction <strong>of</strong> the window. To our knowledge this was previouslypossible only for white noise -although the traditional resultsare generally valid for noise that varied as 1- 8 , where a wasequal to or lesll than 4.II.Spectrum Analyzer BuiesThe spectrum analyzer which W!lS U!ed in the experimentalwork reported here is fairly typical <strong>of</strong> a number c:i such instrumentscurrently aV1l.ilable from various manufacturers. Thebasic measurement process generally consists <strong>of</strong> taking a string<strong>of</strong> N. =1024 digital samples <strong>of</strong> the input wave form, which werepresent here by XI, X 1 , ..•, XN•. The basic measurementperiod was 4 IDS. This yields a sampling time t:.t = 3.90625 iJS.Associated with the FFT <strong>of</strong> a time series with S. data points.there are usually (N./2) + 1 = 513 frequencies)I, = N.ut' j =0, 1, ... , .'11./2.The fundamental frequency II is 250 Hz, <strong>and</strong> the Nyquist frequencyI N.n is 128 kHz. Since the spectrum analyzer usesan anti-aliasing filter which significantly distorts the high frequencyportion <strong>of</strong> the spectrum, the instrument only displaysthe measured spectrum for the lowest 400 nonzero frequencies,namely, II = 250 Hz, h =500 Hz, . ", 1400 = 100 kHz.The exact details <strong>of</strong> how the spectrum analyzer estimatesthe spectrum for X I, ..., X N. are unfortunately not providedin the documentation !Upplied by the manufacturer, so the followingmust be regarded only as a reasonable guess on our partas to its operation (see [1] for a good discussion on the basicideas behind a spectrum lUlalyzer; two good general referencesfor spectral lUlalysis are [2] <strong>and</strong> [4]). The sample mean,_ 1 N.Xa N LXr,• talis subtracted from each ci the samples, <strong>and</strong> each <strong>of</strong> these "demeaned"~ples is multipled by a window h, (sometimes calleda data taper) to produceThe spectral estimate,(.) -)X, = h, (X, - X .TN-248j = O. 1. .....V. /2.