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NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

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198 SAMUEL R. STEINknow the time <strong>of</strong> a clock, one needs to perform the integration in Eq. (12-1l).The missing frequency measurements must be bridged by estimating theaverage frequency over the gap, resulting in a time error that is propagatedforever. Thus, it is preferable to always make measurements at a level <strong>of</strong> themeasurement hierarchy equal to or above the level corresponding to thequantity <strong>of</strong> principle interest. In the past this was rather difficult to do.Measurement systems constructed from simple commercial equipment sufferedfrom dead time, that is, they were inactive for a period after performinga measurement. To make matters worse, methods for measuring time orphase had considerably worse noise performance than methods for measuringfrequency. As a result, many powerful statistical techniques weredeveloped to cope with these problems (Barnes, 1969: Allan, 1966). The effect<strong>of</strong> dead time on the statistical analysis has been determined (Lesage <strong>and</strong>Audoin, 1979b). Other techniques have been developed to combine shortdata sets so that the parameters <strong>of</strong> clocks over long periods <strong>of</strong> time could beestimated despite missing data (Lesage, 1983). The rationale for theseapproaches is considerably diminished today. Low-noise techniques for themeasurement <strong>of</strong> oscillator phase have been developed. Now, commercialequipment is capable <strong>of</strong> measuring the time or the total phase <strong>of</strong> an oscillatorwith very high precision. Other equipment exists for measuring the timeinterval. These devices use the same techniques that were previouslyemployed for the measurement <strong>of</strong> frequency <strong>and</strong> are very competitive inperformance.The proliferation <strong>of</strong> microcomputers <strong>and</strong> microprocessors has had anequally pr<strong>of</strong>ound effect on the field <strong>of</strong> time <strong>and</strong> frequency measurement.There has been a dramatic increase in the ability <strong>of</strong> the metrologist to acquire<strong>and</strong> process digital data. Many instruments are available with suitablest<strong>and</strong>ard interfaces such as IEEE-583 or CAMAC (IEEE, 1975) <strong>and</strong>IEEE-488 (IEEE, 1978). As a result, there has been a dramatic change indirection away from analog signal processing toward the digital, <strong>and</strong> thisprocess is accelerating daily. Techniques once used only by nationalst<strong>and</strong>ards laboratories <strong>and</strong> other major centers <strong>of</strong> clock development <strong>and</strong>analysis are now widespread. Consequently, this chapter will focus first onthe peak <strong>of</strong> the measurement hierarchy <strong>and</strong> the use <strong>of</strong> digital signalprocessing. But the analysis is directed toward estimating the traditionalmeasures <strong>of</strong> frequency stability. Considerable attention will be paid toproblems associated with estimating the confidence <strong>of</strong> these stability measures<strong>and</strong> obtaining the maximum information from available data.The IEEE has recommended as its first measure <strong>of</strong> frequency stability theone-sided spectral density Sy(f) <strong>of</strong> the instantaneous fractional-frequencyfluctuations J(t). It is simply related to the spectral density <strong>of</strong> phase fluctuationssince differentiation <strong>of</strong> the time-dependent functions is equivalent toTN-68

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