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NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

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Weean make the following general remarks aboutpower-law noise processes:1. R<strong>and</strong>om walk FM (1/f4) noise is difficultto measure since it is usua 11 y veryclose to the carrier. R<strong>and</strong>om walk FMusually relates to the OSCILLATOR'SPHYSICAL ENVI RONMENT. If r<strong>and</strong>om lola 1k FMis a predominant feature <strong>of</strong> the spectraldensity plot then MECHANICAL SHOCK,VIBRATION, TEMPERATURE, or other environmentaleffects lIlay be causing "r<strong>and</strong>om"shifts in the carrier frequency.2. Flicker FM (1/f 3 ) is a noise whosephysical cause is usually not fullyunderstood but may typically be relatedto the PHYSICAL RESONANCE MECHANISM OFAN ACTIVE OSCI LLATOR or the DESIGN ORCHOICE OF PARTS USED FOR THE ELECTRONICS,or ENVIRONMENTAL PROPERTIES. Flicker FMis common in high-quality oscillators,but may be masked by white FM (1/f 2 ) orfliCker PM (1/f) in lower-quality oscillators.3. White FM (1/f2) noise is a common typefound in PASSIVE-RESONATOR FREQUENCYSTANDARDS. These contain a slave oscillator,<strong>of</strong>ten quartz, which is locked toa resonance feature <strong>of</strong> another devi cewhich behaves much like a high-Q filter.Cesium <strong>and</strong> rubidium st<strong>and</strong>ards have whiteFM noise characteristics.4. Fl iclter PM (1/t) noi se may relate to aphysical resonance mechanism in anoscillator, but it usually is added byNOISY ELECTRONICS. Thi s type <strong>of</strong> noi seis common, even in the highest qualityoscillators, because in order to bringthe signal amplitUde up to a usablelevel, amplifiers are used after thesignal source. Flicker PM noise may beintroduced in these stages. It may alsobe introduced in a frequency multiplier.• See Appendix <strong>Note</strong> /I 7*38Flicker PM can be reduced with gDodlow-noise amplifier design (e.g., usingrf negative feedback) <strong>and</strong> h<strong>and</strong>-selectingtransistors <strong>and</strong> other electronic components.5. Whi te PM (f0) noi se is broadb<strong>and</strong> phasenoi se <strong>and</strong> has 1itt1e tD do ....ith theresonance mechanism. It is probablyproduced by similar phenomena as flickerPM (1/f) noise. STAGES OF AMPLIFICATIONare usually responsible for ....hite PMnoise. This noise can be kept at a very10.... value ....ith good amp 1ifier design,h<strong>and</strong>-selected components, the addition<strong>of</strong> narrowb<strong>and</strong> fi lteri ng at the output.or increasing, if feasible, the pDwer <strong>of</strong>the primary frequency sDurce. 1312.2 Other types <strong>of</strong> nDiseA common1y encDuntered type <strong>of</strong> no i se from asignal source or measurement apparatus is thepresence <strong>of</strong> 60 Hz A.C. line noise. Sho....n infigure 12.2 is a CDnstant ....hite PM noise source....i th 60 Hz, 120 Hz <strong>and</strong> 180 Hz components added.This kind <strong>of</strong> nDise is usually caused by AC powergetti ng into the measurement system or the. sourceunder test. In the plot <strong>of</strong> S(j)(f) , one observesdiscrete line spectra. Although S$(f) is a measure<strong>of</strong> spectral density, one can interpret the linespectra ....ith no loss <strong>of</strong> general i ty. although oneusually does not refer to spectral densities whenCharacterizing discrete lines. Figure 12.3 is thetime domain representation <strong>of</strong> the same white phasemodulation level ....ith 60 Hz noise. <strong>Note</strong> that theamplitUde <strong>of</strong> ay(t) varies up <strong>and</strong> down depending onsampling time. This is because in the time domainthe sensitivity to a periodic ....ave varies directlyas the sampling interval. This effect (which isan alias effect) is a very powerful tool forfiltering out a periOdic wave imposed on a signalsource. By sampling in the time domain at integerperiods, one is virtually insensitive to theperiodic (discrete line) term.IN-51

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