120ACK!W9;"LEllGMENTThe authors are particularly indebted to D. W. All8Jl,Dr. D. Halford, Dr. S. Jar\'is, <strong>and</strong> Dr. J. J. Filliben <strong>of</strong>the National Bureau <strong>of</strong> St<strong>and</strong>ards. The authors are alsoindebted to Mrs. Carol Wright for preparing the manyrevised copies <strong>of</strong> this paper.REFERENCES[1] E. T. Ja)-nes, "Information theory IUld .tatinica1 mechanips,"PhY3. Rev., vol. lOS, !leC. 15, Oct. 1957, pp. 171-190.[2] C. BlDgham, M. D. Godfrey, IUld J. W. Tukey, "Moderntechniques <strong>of</strong> power spectrum estimation," IEEE Tram.Audio ElectrOC01.l&t., vol. AU-15, June 1967, pp. 56-66.[3] R. B. Bladanan, Linear DilUl ST/l.Qothif'l{} <strong>and</strong> Prediction in.Thecrv <strong>and</strong> Practice. Reading, MflBS.: Addison-Wesley,1965.[4] R. B. BlackmlUl <strong>and</strong> J. W. Tukey, The Measu.rement <strong>of</strong>POlDer Spectra. New York: Donr, 1958.[5] E. O. Brigham <strong>and</strong> R. E. Morrow, "The fast Fouriertransform," IEEE Spectrum, vol. 4, Dec. 1967, pp. 63-70.[6] E. J. Baghdady, R. D. Lincoln, IUld B. D. Nelin. "Shorttermfrequency stability: theory, mellSUrement, <strong>and</strong> sta.tus,"Proc. IEEE-NASA Slimp. on Short-Term Frequency Stability(NASA SP-80) , ~o,. 1964, pp. 65-87; also in PTC/c.IEEE, "01. 53, JuJy 1965, pp. 70+-722 <strong>and</strong> Proc. IEEE (CorrespJ,vol 53, Dec. 1965. pp. 2110-2111.[7) L. Cutler <strong>and</strong> C. Searle. "Some aspecUl <strong>of</strong> the theory <strong>and</strong>mellSUrement <strong>of</strong> freQUoenc~' fluctuatioll8 in frequency st<strong>and</strong>ards."Proe. IEEE, vol. 54, Feb. 1966, pp. 136-154.[8] D. W. AllBll, "Statistics <strong>of</strong> atomic frequency st<strong>and</strong>ards,"Proc. IEEE, vol. 54, Feb. 1966, pp. 221-230.[9] N. A. Shews.rt, Economic Control <strong>of</strong> Q1Ullity <strong>of</strong> M emufacturedProduct. Princeton, N. J.: "Van ~ostr<strong>and</strong>, 1931,p.l46.[IO] J. A. Barnes, "Atomic timekeeping <strong>and</strong> the statistics <strong>of</strong>precision signal generatom," Proc. IEEE, "01. 54, Feb. 1966,pp. 207-220.[11] J. A. Barnea <strong>and</strong> D. W. Allan, "An approach to the prediction<strong>of</strong> coordinated uni"er:u.l time," Frequ.en.c'V, vol.5, :So".-Dec. 196i, pp. 15-20.[12] R. F. C. Vesset et 01., "An intercom~arison <strong>of</strong> hydrogen<strong>and</strong> cesium frequency art<strong>and</strong>e..rda," IEEE Tram. ImtTli.m.Me08., vol. IM-15, Dee. 1966, pp. 165-175.[13] J. A. Barnes, "Twles <strong>of</strong> hiu functioll8, B, <strong>and</strong> Bt. forvariances hued on finite samples <strong>of</strong> processes with powerlaw spectral densities," NBS, Wuhington, D. C., Tech. Kote375, Jan. 1969.[14] D. B. Leeson <strong>and</strong> G. F. Johnson, "Short-term stability fora Dopp,ler radar: requirements, measurements, IUld techniQues,, Proc. IEEE, vol. MJ.Feb. 1966,_ pp. 244-248.[15] W. K. Saunders in Radar n<strong>and</strong>book, M. I. Skolnik, Ed.New York: McGraw Bill, 1970, ch. 16.[16] R. S. Raven, "Requirements on muter oscillators for coherentradar," Proe. IEEE, vol. 54, Feb. 1966, pp. 23;-243.[Ii] D. B. Lee!lOD, "A simple model <strong>of</strong> feedback oscillator noisespectrum," Proc. IEEE (Lett.), "01. 54, Feb. 1966, pp. 329330.[18] R. F. C. Yessot, L. Mueller, <strong>and</strong> J. "Vanier. "The specification<strong>of</strong> oscillal.or cheracteristics from measurements I:ladein the frequen~y domain," Proc. IEEE, \'01. 54, Feb. 1966.pp. 199-207.[19] Floyd ~f. Gardner, Phascloe/: Techniques. :S-ew York:Wile\·. 1966.[20] C. Menoud, J. Racine. <strong>and</strong> P. Kartasch<strong>of</strong>f. "Atomic hydro@:en maser work al L.5-.R.H .. ~euchalel. Switzerl<strong>and</strong>." Proc.£lst Ann. Symp. Frequency Control, Apr. 1%7. pp. 543-567.[21l A. G. Mungall, D. Morris, H. Daams, <strong>and</strong> R. Bailey. "Atomichydrogen maser de"elopmen~ at the ~atioDal ResearchCouncil <strong>of</strong> Canada." Metrologuz, "01. 4. July 1968, pp. 87-94[22] R. F. C. Vessot, "Atomic h)'drogen masel>. IUl introduction<strong>and</strong> progress report," Hewlett-Packard J., "01. 20, Oct.1968, pp. 15-20.Reprinted by permission fromIEEE TRA:'\SACTIO:'\S 0:\l~STRCME:\TATIO:'\ A~D ME.-\SCRDIE'\T\'01. V,f·20. ~o. 2. !\fa\ 1971Copyright ® 19i1. hy the Institute <strong>of</strong> E;leclrical ~nd Electronics Engineers. IncPRINTED I~ THE L.SA.
142 Rep. 580--2Reprinted, with permIssIOn, from Report 580 <strong>of</strong> the International Radio ConsultativeCommittee (C.c.I.R.), pp. 142-150, 1986.CHARACTERIZATION OF FREQUENCY AND l-HASE NOISE(Study Programme 3BI7)*(1974-1978-1986)l. IntrodudfollTechniques to characterize <strong>and</strong> to measure the frequency <strong>and</strong> phase instabilities in frequency generators<strong>and</strong> received radio signals are <strong>of</strong> fundamental importance to users <strong>of</strong> frequency <strong>and</strong> time st<strong>and</strong>ards.In 1964 a subcommittee on frequency stability was formed, within the Institute <strong>of</strong> Electrical <strong>and</strong> ElectronicEngineers (IEEE) St<strong>and</strong>ards Committee 14 <strong>and</strong> later (in 1966) in the <strong>Technical</strong> Committee on Frequency <strong>and</strong>Time within the Society <strong>of</strong> Instrumentation <strong>and</strong> Measurement (SIM), to prepare an IEEE st<strong>and</strong>ard on frequencystability. In 1969, this subcommittee completed a document proposing definitions for measures on frequency <strong>and</strong>phase stabilities. These recommended measures <strong>of</strong> stabilities in frequency generators have gained generalacceptance among frequency <strong>and</strong> time users throughout the world. Some <strong>of</strong> the major manufacturers now specifystability characteristics <strong>of</strong> their st<strong>and</strong>ards in terms <strong>of</strong> these recommended measures.Models <strong>of</strong> the instabilities may include both stationary <strong>and</strong> non-stationary r<strong>and</strong>om processes as well assystematic processes. Concerning the apparently r<strong>and</strong>om processes, considerable progress has been made[IEEE-NASA, 1964; IEEE, 1972] in characterizing these processes with reasonable statistical models. In contrast,the presence <strong>of</strong> systematic changes <strong>of</strong> frequencies such as drifts should not be modelled statistically, but should bedescribed in some reasonable analytic way as measured with respect to an adequate reference st<strong>and</strong>ard, e.g., linearregression to determine a model for linear frequency drift. The separation between systematic <strong>and</strong> r<strong>and</strong>om partshowever is not always easy or obvious. The systematic effects generally become predominant in the long term, <strong>and</strong>thus it is extremely important to specify them in order to give a full characterization <strong>of</strong> a signal's stability. ThisReport presents some methods <strong>of</strong> characterizing the r<strong>and</strong>om processes <strong>and</strong> some important types <strong>of</strong> systematicprocesses.Since then, additional significant work has been accomplished. For example, Baugh [1971] illustrated theproperties <strong>of</strong> the Hadamard variance - a time-domain method <strong>of</strong> estimating discrete frequency modulationsideb<strong>and</strong>s - particularly appropriate for Fourier frequencies less than about 10 Hz; a mathematical analysis <strong>of</strong>this technique has been made by Sauvage <strong>and</strong> Rutman [1973]; Rutman [1972] has suggested some alternativetime-domain measures while still giving general support to the subcommittee's recommendations; De Prins et al.[1969] <strong>and</strong> De Prins <strong>and</strong> Cornelissen, [1971] have proposed alternatives for the measure <strong>of</strong> frequency stability inthe frequency domain with specific emphasis on sample averages <strong>of</strong> discrete spectra. A National Bureau <strong>of</strong>St<strong>and</strong>ards Monograph ,devotes Chapter 8 to the "Statistics <strong>of</strong> time <strong>and</strong> frequency data analysis" [Blair, 1974]. Thischapter contains some measurement methods, <strong>and</strong> applications <strong>of</strong> both frequency-domain <strong>and</strong> time-domainmeasures <strong>of</strong> frequency/phase instabilities. It also describes methods <strong>of</strong> conversion among various time-domainmeasures <strong>of</strong> frequency stability, as well as conversion relationships from frequency-domain measures to timedomainmeasures <strong>and</strong> vice versa. The effect <strong>of</strong> a finite number <strong>of</strong> measurements on the accuracy with which thetwo-sample variance is determined has been specified [Lesage <strong>and</strong> Audoin, 1973, 1974 <strong>and</strong> 1976;Yoshimura, 1978]. Box-Jenkins-type models have been applied for the interpretation <strong>of</strong> frequency stabilitymeasurements [Bames, 1976; Percival, 1976] <strong>and</strong> reviewed by Winkler [1976].Lindsey <strong>and</strong> Chie [1976] have generalized the r.m.s. fractional frequency deviation <strong>and</strong> the two-samplevariance in the sense <strong>of</strong> providing a larger class <strong>of</strong> time-domain oscillator stability measures. They have developedmeasures which characterize the r<strong>and</strong>om time-domain phase stability <strong>and</strong> the frequency stability <strong>of</strong> an oscillator'ssignal by the use <strong>of</strong> Kolmogorov structure functions. These measures are connected to the frequency-domainstability measure Sy(f) via the Mellin transform. In this theory, polynominal type drifts are included <strong>and</strong> sometheoretical convergence problems due to power-law type spectra are alleviated. They also show the closerelationship <strong>of</strong> these measures to the r.m.s. fractional deviation (Cutler <strong>and</strong> Searle, 1966] <strong>and</strong> to the two-samplevariance [Allan, 1966J. And finally, they show that other members from the set <strong>of</strong> stability measures developed areimportant in specifying performance <strong>and</strong> writing system specifications for applications such as radar, communications,<strong>and</strong> tracking system engineering work.Other forms <strong>of</strong> limited sample variances have been discussed (Baugh, 1971; Lesage <strong>and</strong> Audoin, 1975;Boileau <strong>and</strong> Picinbono, 1976] <strong>and</strong> a review <strong>of</strong> the classical <strong>and</strong> new approaches has been published[Rutman, 1978~* See Appendix <strong>Note</strong> # 23 TN-162
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Characterization ofClocks and Oscil
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PREFACEFor many years following its
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TOPICAL INDEX TO ALL PAPERSThe foll
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of the wide range of measurement si
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The first of these (D.l) by Lesage
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Table 1. Guide to Selection of Meas
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10- 1410- 15c-een10- 1610- 1710- 18
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where V0 ;: nomi na I peak vo Itage
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ports of the pair of double balance
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1n tenns of the typical performance
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varactor control in th@ reference o
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10.7 Time Domain-Frequency Domain T
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frequency extent of the analysis ba
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28. P. Kartaschoff and J. Barnes, "
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400 CHAPTER BIBLIOGRAPHIESAllan. D.
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402 CHAPTER BIBLIOGRAPHIESBaugh. R.
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average frequency over the interval
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BL-\5ES .-\.\D \·A.Rl.-\.\CES OF S
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100%CUMULATIVE PERIODOGRAM ~50%(,
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REFERENCES1. D.W. Allan, "The Measu
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5.12 )( 10 - 7 SEC
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100%CUMULATIVE PERIODOGRAM -50%U'
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MR. McCASKILL:Well, let me go furth
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NIST Technical Note 1318, 1990.VARI
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By definition, white noise has a po
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where aZ(N,T,r) is the expected sam
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Some useful asymptotic forms of B 3
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Since the time-domain definition fo
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Stability Using Non-zero Dead-Time
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I!II.....I~I.....cIQ)IEQ) I~I~(J)
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AppendixWith reference to figure 1,
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8lIN,r,lll) for r = .011\1\ N= ~ 81
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BUN,r,IItJI for r =/tl\ !'I= 8 16 3
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81 (N,r,lIUl for r =ItJ \ IF 4 8 16
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BllN,r,kl) for r = 1024It! \ N= 4 B
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B3( 2, P1,I", IIU) far r '" .01~\ ~
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83(2,I'f,r,~)for r '"""'III \ 2 4 B
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B3(2,"',r,ail for r = 1024MIl \ I'l
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E. APPENDIX - Notes and ErrataThe n
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Influence of Pressure and Humidity
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22. page TN-160In eqs (101), (102),
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29. page TN-180If the ratio of T/ T
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NIST-114A(REV. 3-89)4. TITLE AND SU