NIST Technical Note 1337: Characterization of Clocks and Oscillators

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286 A. L LANCE, W. D. SEAL, AND F. LABAAR(3) Approximately 40 dB is set in the precision IF attenuator. The systemis adjusted for an out-of-phase quadrature condition.(4) The modulation frequency and power level are measured by theautomatic baseband spectrum analyzer. The total carrier-power referencelevel is measured power, plus the carrier-sideband modulation ratio, plusthe IF attenuator setting.(5) The AM modulation is removed. the IF attenuator set to 0 dB, andthe system re-checked to verify the out-of-phase quadrature (maximum dcoutput from the mixer IF port). Noise (Vn) is measured at the selected Fourierfrequencies. A direct calculation ofm(f) in dBc/Hz ismU) = [(modulation power (dBm) + carrier-sideband ratio (dB)+ IF attenuation (dB) - noise power (dBm) + 2.5 dB- 10 10g(BW)]. (102)Figure 27 illustrates the measurements of AM and phase noise of twoGUNN oscillators that were offset in frequency by I GHz. The measurementswere performed using the coaxial delay-line system.FOURIER FREQUENCY (Hz)FIG.27 Phase noise and AM noise of 40- and 41-GHz Gunn oscillators. (From Sealand Lance. 1981.)TN-237
7. PHASE NOISE AND AM NOISE MEASUREMENTS 287V. ConclusionThe fundamentals and techniques for measurement of phase noise havebeen set forth for two basic systems. The two-oscillator technique providesthe capability for measuring high-performance cw sources. The systemsensitivity is superior to the single-oscillator technique for measuring phasenoise very close to the carrier.High-stability sources such as those used in frequency standards applicationscan be measured without using phase-locked loops. However, mostmicrowave sources exhibit frequency instability that requires phase-lockedloops to maintain the necessary quadrature conditions. The characteristicsof the phase-locked loops must be evaluated to obtain the source phasenoise characteristics. Also. in principle, one must have three sources at thesame frequency to characterize a given source. If three sources are not available,one must assume that either one source is superior in performance orthat they have equal phase noise contributions.The single-oscillator technique employing the delay line as an FM discriminatorhas adequate sensitivity for measuring most microwave sources.The economic advantages of using this system include the fact that onlyone source is required, phase-locked loops are not required, system configurationis relatively inexpensive, and the system is inherently insensitive tooscillator frequency drift.The single-oscillator technique using the delay-line discriminator canbe adapted to measure the phase noise of pulsed sources. Pulsed sourceshave been measured at 94 GHz by F. Labaar at TRW. Redondo Beach,California.ACKNOWLEDGMENTSOur inItial preparations for developing a phase noise measurement capability were the resultof discussions WIth Dr. 10rg Raue of TRW. Our first phase noise development effort wasassisting in the evaluauon of phase noise measurement systems designed and developed byBill Hook of TRW (Hook, 1973). The efforts of Don Leavill ofTRW were vital in initiating themeasurement program.We are very grateful to Dr. Donald Halford of the National Bureau ofStandards in Boulder,Colorado, for his interest, consuhauons, and valuable suggestions during the development ofthe phase noise measurement systems at TRW.We appreciate the measurement cross-checks perfonned by C. Reynolds. 1. Oliverio. andH. Cole of the Hewlett-Packard Company. Dr. 1. Robert Ashley of the University of Colorado.ColoradO Springs, and G. Rast of the U.S. Army Missile Command, Redstone Arsenal,Huntsville, Alabama.REFERENCESAllen. D. W. ([966). Proc.IEEE54. 221-230.Ashley. 1. R.. Searles, C. B.. and Palka. F. M. (1968). IEEE Trans. Microwave Theory Tech.MlT-I6(9),753-760.TN-238
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Characterization ofClocks and Oscil
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PREFACEFor many years following its
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0 • • • • • • • •
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0 •• 0 •• 0 •• 0 •
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TOPICAL INDEX TO ALL PAPERSThe foll
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of the wide range of measurement si
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The first of these (D.l) by Lesage
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Table 1. Guide to Selection of Meas
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10- 1410- 15c-een10- 1610- 1710- 18
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Table 2. Ratio of mod a~('r) to a~(
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of the frequency measured in this m
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From: Proceedings of the 35th Annua
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where V0 ;: nomi na I peak vo Itage
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ports of the pair of double balance
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fluctuations prior to the bias box
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up an interesting hierarchy of kind
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is determi ned by the measurement s
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Since each average of the fractiona
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Thus. with 9~ probability the calcu
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in fact. Also for n=l the "experime
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1n tenns of the typical performance
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and eq (1.1) we get2m>(t) = ~T(t) =
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varactor control in th@ reference o
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V nn5(45 Hz) = 100 nV por root hort
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We can use the convolution theorem
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though the concept of harmonics in
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and wz(t) is now the si!npled versi
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10.7 Time Domain-Frequency Domain T
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o/(t). In the table, the left colum
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Weean make the following general re
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-flO• r.1OSP1 t(f2-,~ 1Ci~-/'10 f
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frequency extent of the analysis ba
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28. P. Kartaschoff and J. Barnes, "
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_--_._~--~II..gIIIIII1.......oIIIII
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From: Precision FrequenC)' Control,
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12 FREQUENCY AND TIME MEASUREMENT 1
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12 FREQUENCY AND TIME MEASUREMENT19
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12 FREQUENCY AND TIME MEASUREMENT 2
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12 FREOU::NCY AND TIME MEASUREMENT2
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12 FREQUENCY AND TIME MEASUREMENTI~
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12 FREOUENCV AND TIME MEASUREMENT21
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228 SAMUEL R. STEIN9.3 GHzOSCILLATO
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230 SAMUEL R. STEINThe combination
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232 SAMUEl R STEINHowever, the spec
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400 CHAPTER BIBLIOGRAPHIESAllan. D.
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402 CHAPTER BIBLIOGRAPHIESBaugh. R.
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404 CHAPTER BIBLIOGRAPHIESConway. A
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406 CHAPTER BIBLIOGRAPHIESGardner.
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408 CHAPTER BIBLIOGRAPHIESJackisch.
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410 CHAPTER BIBLIOGRAPHIESlesage. P
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412 CHAPTER BIBLIOGRAPHIESPaul. F.
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414 CHAPTER BIBLIOGRAPHIESSorden. J
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416 CHAPTER BIBLIOGRAPHIESYoshimura
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648IEEE TRANSACTIONS ON ULTRASONICS
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650 IEEE TRANSACTIONS ON ULTRASONIC
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652 IEEE TRANSACTIONS ON ULTRASONIC
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IEEE TRANSACTIONS ON ULTRASONICS. F
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Powet spectral analysis of the outp
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major difficulty is designing a mix
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The phase noise in the source can c
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detail elsewhere [12]. The low pass
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NJ:",--0~.8~..(/)-110-1:20-130-140m
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is ~he preferred measure, since, un
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2. Copy.r,ion Beeween Frequency and
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All.n, D. Y., .nd D...s, H., Picose
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105Characterization of Frequency St
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B'R:sES et ai.: ClHR.,CTY.RIZHIO:-r
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e4.RNES et al.: CH."R.ACTERrZ.4.TIO
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MII.NES et al.. CHAIl.ACfERlZATlO:-
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:l frequcllcy ~eparatioll froll1 th
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MRNES et al.: CHARACTERIZATION OF F
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B\R~f:S eL al.: CIHRACTERIZ.,TIOI<
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8IR:-IES et al.: CH.'R.'CTER[Z.
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142 Rep. 580--2Reprinted, with perm
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i44 Rep. 580-2If the initial sampli
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146 Rep. 580-2The values of ha are
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148 Rep. SSO-2TABLE II - Translalio
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ISO Rep. 580-2, 738-2BIBLIOGRAPHYAL
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522 LESAGE AND AUDOIN01., 1971J:S,I
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524 LESAGE AND AUDOINKl- 1410- 11 \
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526LESAGE AND AUDOINQuartz ClJstalF
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528 LESAGE AND AUDOINMinrFrequent,r
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530 LESAGE AND AUOOINsuch as c:r;(T
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532 LESAGE AND AUDOINl.l-TEquations
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534 LESAGE AND AUDOINof measurement
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Page 197 and 198: 538 LESAGE AND AUWINstability measu
Page 199 and 200: Copyright Ie) 1984 Academic Press.
Page 201 and 202: 7. PHASE NOISE AND AM NOISE MEASURE
Page 207 and 208: 7. PHASE ~OISE AND AM NOISE MEASURE
Page 211 and 212: 7. PHASE :'-iOrSE AND AM NOISE MEAS
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Page 251 and 252: average frequency over the interval
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Page 265 and 266: N-3n+lEj=1Mod Oy2 (t) =0 2(t) {.! +
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Page 269 and 270: IEEE TRANSACTIONS ON INSTRUMENTATlO
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Page 273 and 274: From: Proceedings of the 15th Annua
Page 275 and 276: where c = Dr/2. In regression analy
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Page 281 and 282: 100%CUMULATIVE PERIODOGRAM ~50%(,
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Page 285 and 286: TABLE 6.STANDARD DEVIATIONSPROCEDUR
Page 287 and 288: APPENDIX AREGRESSION ANALYSIS(Equal
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Page 293 and 294: REFERENCES1. D.W. Allan, "The Measu
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100%CUMULATIVE PERIODOGRAM -50%U'
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100%CUMULATIVE PERIODOGRAM50%(J'l..
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FREQUENCY DRIFT AND WHITESTANDARD D
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MR. McCASKILL:Well, let me go furth
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NIST Technical Note 1318, 1990.VARI
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By definition, white noise has a po
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where aZ(N,T,r) is the expected sam
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Some useful asymptotic forms of B 3
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Since the time-domain definition fo
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Stability Using Non-zero Dead-Time
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I!II.....I~I.....cIQ)IEQ) I~I~(J)
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-2,THE BIAS FUNCTION, 8 2 (r,p.)Fig
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AppendixWith reference to figure 1,
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8lIN,r,lll) for r = .011\1\ N= ~ 81
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BUN,r,IItJI for r =/tl\ !'I= 8 16 3
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81 (N,r,lIUl for r =ItJ \ IF 4 8 16
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__ ....... ~...........__ .........
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BllN,r,kl) for r = 1024It! \ N= 4 B
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B2(r,llU)It! \ r = .0001 .0003 .001
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B3( 2, P1,I", IIU) far r '" .01~\ ~
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83(2,I'f,r,~)for r '"""'III \ 2 4 B
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B312.I'I,r,llU) for r " 4I\J \ pt::
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B3(2,I'I,r,lIJ) Fer r ~ MI\J\ PI::
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B3(2,"',r,ail for r = 1024MIl \ I'l
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E. APPENDIX - Notes and ErrataThe n
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Influence of Pressure and Humidity
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22. page TN-160In eqs (101), (102),
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29. page TN-180If the ratio of T/ T
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NIST-114A(REV. 3-89)4. TITLE AND SU
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NIST Technical Note 1337: Characterization of Clocks and Oscillators

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