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NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

NIST Technical Note 1337: Characterization of Clocks and Oscillators

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MRNES et al.: CHARACTERIZATION OF FREQGENCY ST.,BILITYFrom the analog voltage one may use analog spectrumanalyzers to determine S~ (f), the frequency stability. Byconverting to digital data, other analyses are possibleon a computer.F. Common Hazards1) Errors Caused by Signal-Processing Equipment: Theintent <strong>of</strong> most frequency stability measurements is toevaluate the source <strong>and</strong> not the measuring equipment.Thus, one must know the performance <strong>of</strong> the measuringsystem. Of obvious importance are such aspects <strong>of</strong> themeasuring equipment as noise level, dynamic range,resolution (dead time), <strong>and</strong> frequency range.It has been pointed out that the noise b<strong>and</strong>width fl isvery essential for the mathematical convergence <strong>of</strong> certainexpressions. Ins<strong>of</strong>ar as one wants to measure the signalsource, one must know that the measuring system is notlimiting the frequency response. At the very least, onemust recognize that the frequency limit <strong>of</strong> the measuringsystem may be a very important, implicit parameter foreither .,.:(t) or S.(j). Indeed, one must account for anydeviations <strong>of</strong> the measuring system form ideality such asa "nonflat" frequency response <strong>of</strong> the spectrum analyzeritself.Almost any electronic circuit that processes a signalwill, to some extent, convert amplitude fluctuations at theinput terminals into phase fluctuations at the output.Thus, AM noise at the input will cause a time-varyingphase (or FM noise) at the output. This can impose importantconstraints on limiters <strong>and</strong> automatic gain control(AGe) circuits when good frequency stability is needed.Similarly, this imposes constraints on equipment used forfrequency stability measurements.2) Analog Spectrum Analyzers (Frequency Domain) :Typical analog spectrum analyzers are very similar indesign to radio receivers <strong>of</strong> the superheterodyne type, <strong>and</strong>thus certain design features are quite similar. For example,image rejection (related to predetection b<strong>and</strong>width)is very important. Similarly, the actual shape <strong>of</strong> theanalyzer's frequency window is important since this affectsspectral resolution. As with receivers, dynamicrange can be critical for the analysis <strong>of</strong> weak signals inthe presence <strong>of</strong> substantial power in relatively narrowb<strong>and</strong>widths (e.g., 60 Hz).The slewing rate <strong>of</strong> the analyzer must be consistentwith the analyzer's frequency window <strong>and</strong> the post-detectionb<strong>and</strong>width. If one has a frequency window <strong>of</strong> 1 Hz,one cannot reliably estimate the intensity <strong>of</strong> a brightline unless the slewing rate is much slower than 1 Hz/s.Additional post~detection filtering will further reduce themaximum usable slewing rate.S) Spectral Density Estimation from Time DomainData: It is beyond the scope <strong>of</strong> this paper to present acomprehensive list <strong>of</strong> hazards for spectral density estimation;one should consult the literature [2]-[5J. There115are a few points, however, which are worthy <strong>of</strong> specialnotice: a) data aliasing (similar to predetection b<strong>and</strong>widthproblems); b) spectral resolution; <strong>and</strong> c) COnfidence<strong>of</strong> the estimate.4) Variances <strong>of</strong> Frequency Fluci:ual.ions "':(T): It is notuncommon to have discrete frequency modulation <strong>of</strong> asource such as that associated with the power supplyfrequencies. The existence <strong>of</strong> discrete frequencies in S.(j)can cause .,.:(.,.) to be a very rapidly changing function<strong>of</strong> T. An interesting situation results when T is an exactmultiple <strong>of</strong> the period <strong>of</strong> the modulation frequency (e.g.,one makes T = 1 s <strong>and</strong> there exists 6O-Hz frequencymodulation on the signal). In this situation, .,.:(T = 1 s)can be very optimistic relative to values with slightlydifferent values <strong>of</strong> T.One also must be concerned with the convergenceproperties <strong>of</strong> "':(T) since not all noise processes will havefinite limits to the estimates <strong>of</strong> "':(T) (see Appendix I).One must be as critically aware <strong>of</strong> any "dead time" in themeasurement process as <strong>of</strong> the system b<strong>and</strong>width.5) SigruJ Source <strong>and</strong> Loading: In measuring frequencystability one should specify the exact location in thecircuit from which the signal is obtained <strong>and</strong> the nature<strong>of</strong> the load used. It is obvious that the transfer characteristics<strong>of</strong> the device being specified will depend on the load<strong>and</strong> that the measured frequency stability might beaffected. If the load itself is not constant during themeasurements, one expects large effects on frequencystability.8) Confidence <strong>of</strong> the Estim.a.u: As with any measurementin science, one wants to know the confidence to assign tonumerical results. Thus, when one measures S.U) or ,,:(T),it is important to know the accuracies <strong>of</strong> these estimates.a) The Allan Variance: It is apparent that a singlesample variance u:(4, T, T) does not have good confidence,but, by averaging many independent samples, one canimprove the accuracy <strong>of</strong> the estimate greatly. There is akey point in this statement, "independent samples." Forthis argument to be true, it is important that one samplevariance be independent <strong>of</strong> the next. Since cr:(2, 1", T) isrelated to the first difference <strong>of</strong> the frequency (11),it is sufficient that the noise perturbing Yet) have "independentincrements," i.e., that y(t) be a r<strong>and</strong>om walk.In other words, it is sufficient that S.(j) r-J ,-2 for lowfrequencies. One can show that for noise processes thatare more divergent at low frequencies than r J , it isdifficult (or impossible) to gain good confidence onestimates <strong>of</strong> o?(T). For noise processes that are lessdivergent than r J , no problem exists.It is worth noting that if we were interested in.,.:(N = CD, 1", T), then the limit noise would becomeS.(j) r-J f instead <strong>of</strong> ,-2 as it is for 0-:(2, 1", .,.). Since mostreal signal generators possess low-frequency divergentnoises, (cr:(2, T, T» is more useful than cr:(N = co, T, T).Although the sample variances ,,:(2, T, 1") will not benormally distributed, the variance <strong>of</strong> the average <strong>of</strong> 11'1.TN-156

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