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Complete Report - University of New South Wales

Complete Report - University of New South Wales

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ARCPHOTOVOLTAICSCENTRE OFEXCELLENCE2010/11ANNUAL REPORTPL images illustrate the improvement in uniformityand quality <strong>of</strong> the p + layer achieved by the newfiring process. (a) before and (b) after the lowtemperature treatment.Figure 4.3.2.6Inverted form <strong>of</strong> the PERL (Passivated Emitter and RearLocally diffused) solar cell developed at UNSW basedon the use <strong>of</strong> N-type silicon.Figure 4.3.2.7field in conventional p-type cells. However, they cansignificantly degrade the quality <strong>of</strong> the Al-alloyedemitter in n-type wafers by allowing Al to locallybypass the p + region and directly contact the n-typebulk via a Schottky barrier causing a non-linearshunt. A new and modified firing process hastherefore been developed to avoid the damagefrom such non-uniformities. In this method, apatented low temperature solid phase epitaxialgrowth process is employed after the conventionalstandard spike firing to minimize the impacts <strong>of</strong>these junction discontinuities so that a uniform andgood quality junction as illustrated in Fig. 4.3.2.5 (b)can be achieved.These improvements have facilitated a 15-20mVincrease in Voc relative to those reported in theliterature and efficiencies over 17% for standardscreen-printed solar cell technology withhomogeneous n-type emitter (front surface field)applied to n-type wafers. Figure 4.3.2.6 showsthe improvement in the photoluminescent (PL)response resulting from the improved firing andformation <strong>of</strong> the rear contact and junction.A common problem with the manufacture <strong>of</strong>conventional screen-printed solar cells is minuteamounts <strong>of</strong> aluminium paste accidently cominginto contact with the cell front surface. This canhappen when wafers are face down during theprinting <strong>of</strong> the rear or during wafer transfer/handling. Aluminium paste contamination <strong>of</strong> suchsurfaces and transfer belts happens relatively easilyin a production environment such as through abroken wafer that has been Al printed, operators’contaminated gloves, tiny holes in the screenprintingscreen etc. However such contaminationwith the current rear junction n-type technologycreates unusual photoactivated shunts that are notpresent in the dark.This is because a p-n-p transistor structure is formedwhen the unwanted aluminium on the top surfaceis fired into the n-type surface (with the second p-njunction <strong>of</strong> course being at the rear <strong>of</strong> the device).In this phototransistor, the lightly doped waferforms the base <strong>of</strong> the transistor, and despite thebase being very thick, approaching200 microns, the high lifetime <strong>of</strong> theCZ n-type material allows the transistorto achieve moderate gain levels andtherefore conduct large currents whenilluminated by light that generatesthe necessary base current for thetransistor. The unusual consequenceis that the apparent shunt resistance<strong>of</strong> the cell is very poor (low) whenilluminated brightly, increasing tohigh values in the dark or even lowillumination levels. The ramifications<strong>of</strong> this for cell efficiency and fill-factorare that values fall with reducing lightintensity as is normally the case forshunted cells, but with values increasing againfor low illumination levels as the shunt problemsdisappear as the phototransistors are deactivated.Even without such phototransistor shunting,analysis <strong>of</strong> such homogeneous emitter n-typedevices indicates that even higher voltagesare potentially achievable if not for the largedark saturation current contribution from theheavily doped phosphorus diffused top surface.This emphasises the importance <strong>of</strong> moving tothe equivalent <strong>of</strong> a selective emitter design forthe front surface to facilitate both improvedshort wavelength response as well as increaseddevice voltages.4.3.2.3.4.2 N-type Screen-Printed Cellswith the Equivalent <strong>of</strong> a Selective EmitterUntil recently, the Centre held the world record(jointly with Stanford <strong>University</strong>) for the mostefficient n-type silicon devices with 22.7% efficiency.The cell design was based on the inverted form<strong>of</strong> the PERL (Passivated Emitter and Rear Locallydiffused) solar cell developed at UNSW and isshown below. In this work, the cell design hasbeen adapted to accommodate the use <strong>of</strong> low costscreen-printed solar cell processes involving thealignment <strong>of</strong> the screen-printed front metal lines tothe heavily doped n + regions to form the equivalent<strong>of</strong> a selective emitter on the front surface and theSchematic <strong>of</strong> a laser dopedAl-alloyed rear junction n-typesolar cell.Figure 4.3.2.829

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