Electronic Material Properties - und Geowissenschaften ...
Electronic Material Properties - und Geowissenschaften ...
Electronic Material Properties - und Geowissenschaften ...
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spectrometer (AMS) (method performed in cooperation with University of Hannover and<br />
AMS-Laboratory in Glasgow).<br />
During a second field campaign in January/February 2007 several stratigraphic sections<br />
in the Semliki, B<strong>und</strong>ibugyo, Mobuku, and Kasese areas were mapped in detail to<br />
resolve the temporal and spatial relationship between lake sediments, distal floodplain<br />
sediments, and proximal alluvial fan deposits. Interfingering is complex due to<br />
contemporaneous influence of both fluctuating climatic and tectonic events. At key<br />
localities and if lithology was appropriate, lightproof samples for OSL-dating were<br />
excavated. Comparable to TCN-dating, the OSL-method requires highly sophisticated<br />
preparation and measurement performance that can be provided by the OSL lab at<br />
Liverpool University.<br />
A high-resolution DEM (30m) helps to analyse the landscape morphometry of the rift<br />
flanks. Beside a visual interpretation of the DEM, ArcGIS helps to quantify the<br />
morphometric parameters (catchment size, hydrological properties).<br />
Fig. 1: High resolution DEM of the Rwenzori Mountains situated in the western branch of the<br />
East African Rift system.<br />
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