Electronic Material Properties - und Geowissenschaften ...
Electronic Material Properties - und Geowissenschaften ...
Electronic Material Properties - und Geowissenschaften ...
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Figure 2 shows a selected region of the diffraction pattern of filaments irradiated with<br />
different fluences. The position of the dominant reflection of β-NbTi remains unchanged,<br />
i.e., there is no obvious change of the lattice parameters. The weak reflection of the<br />
equilibrium hcp α-Ti phase decreases already at a low fluence of 3×10 11 ions/cm 2 . By<br />
TEM, we find evidence for the hexagonal ω-Ti phase probably resulting from a transition of<br />
α- into ω-Ti [3]. Neither track formation nor any other phase transition or amorphization of<br />
the β-NbTi phase was detected.<br />
Fig. 2: X-ray diffraction pattern of filaments as function of applied fluence.<br />
Irradiated filaments showed changes of the β-NbTi texture, but quantitative analysis is<br />
problematic due to the small diameter of the filaments. We therefore measured larger foil<br />
samples with a ( 100)[<br />
110]<br />
texture before and after irradiation at a four-circle<br />
diffractometer. Comparing their pole figures gives evidence of irradiation-induced<br />
degradation and rotation of the azimuthal distribution of the (100) planes (Fig. 3).<br />
Fig. 3: (100) pole figures of NbTi-foil (left: virgin, right: irradiated with 10 12 cm -2 U ions).<br />
References<br />
[1] L. Latysheva, N. Sobolevskiy, G. Moritz, E. Mustafin, G. Walter, GSI Scientific Report<br />
2003 (May 2004) p. 252.<br />
[2] S.T. Sekula, J. Nucl. Mat. 72 (1978) 91.<br />
[3] H. Dammak, A. Dunlop, D. Lesueur, Nucl. Instr. Meth. B 107 (1996) 204.<br />
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