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Electronic Material Properties - und Geowissenschaften ...

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Publications<br />

Fleissner, A.; Schmid, H.; Melzer, C.; Schmechel, R.; von Seggern, H.; Transition from<br />

Non-Dispersive to Dispersive Hole Transport in a Small Molecule Organic Semiconductor<br />

Controlled by Molecular Doping, MRS Proceedings 965E (2006) S14<br />

Hesse, S.; Zimmermann, J.; von Seggern, H.; Ehrenberg, H.; Fuess, H.; Fasel, C.; Riedel,<br />

R.; CsEuBr3: Crystal structure and its role in the photostimulation of CsBr : Eu 2+ , J. Appl.<br />

Phys. 100 (2006) 083506<br />

Neumann, F.; Genenko, Y. A.; Melzer, C.; von Seggern, H.; Self-consistent theory of<br />

unipolar charge-carrier injection in metal/insulator/metal systems, J. Appl. Phys. 100<br />

(2006) 084511<br />

Benson, N.; Schidleja, M.; Melzer, C.; Schmechel, R.; von Seggern, H.; Complementary<br />

organic field effect transistors by ultraviolet dielectric interface modification, Appl. Phys.<br />

Lett. 89 (2006) 182105<br />

Benson, N.; Ahles, M.; Schidleja, M.; Gassmann, A.; Mankel, E.; Mayer, T.; Melzer, C.;<br />

Schmechel, R.; von Seggern, H.; Organic CMOS technology by interface treatment, Proc.<br />

SPIE 6336 (2006) 63360S<br />

Olivati, C. A.; Carvalho, A. J. F.; Balogh, D. T.; von Seggern, H.; Faria, R. M.; Effect of ion<br />

concentration of ionomer in electron injection layer of polymer light-emitting devices, J.<br />

Non-Cryst. Solids 352 (2006) 1686<br />

Zhou, Y.; Yan, X.; Kroke, E.; Riedel, R.; Probst, D.; Thissen, A.; Hauser, R.; Ahles, M.; von<br />

Seggern, H.; Deposition temperature effect on the structure and optical property of RF-<br />

PACVD-derived hydrogenated SiCNO film, Mat.-wiss. u. Werkstofftech. 37 (2006) 173<br />

Hu, Z.; von Seggern, H.; Breakdown-induced polarization buildup in porous fluoropolymer<br />

sandwiches: a thermally stable piezoelectret, J. Appl. Phys. 99 (2006) 024102<br />

Neumann, F.; Genenko, Y. A.; von Seggern, H.; The Einstein relation in systems with trapcontrolled<br />

transport, J. Appl. Phys. 99 (2006) 013704<br />

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