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Electronic Material Properties - und Geowissenschaften ...

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The effect of crystallinity on the thermal instability<br />

of gold nanowires<br />

S. Karim, W. Ensinger<br />

Metallic nanowires are an important component of future nanoscale devices. Among<br />

other important factors, the thermal stability of nanowires is crucial for a reliable<br />

performance of nanowire based devices. Recent experimental and theoretical results<br />

demonstrate that the so-called Rayleigh instability causes the decay of a cylindrical<br />

nanowire into nanospheres in particular at elevated temperatures where atomic<br />

movement by diffusion becomes significant. This pose a serious obstacle to the<br />

sustained reliability of nanowire based devices. For this reason, the Rayleigh<br />

instability of gold nanowires was investigated. The emphasis was on their<br />

crystallographic properties.<br />

Cylindrical gold nanowires with diameters D = 87 nm were prepared by<br />

electrochemical deposition in Polycarbonate templates. The polymer foils of<br />

thickness 30 µm were irradiated normal to the surface at the UNILAC linear<br />

accelerator of GSI, Darmstadt, with uranium ions of energy 2 GeV at a fluence 10 8<br />

ions/cm 2 . Nanoporous templates were then produced by chemically etching the latent<br />

ion tracks. After deposition of a conductive Cu back-electrode, wires were grown<br />

electrochemically in the templates. By systematically varying the deposition<br />

conditions, polycrystalline (PC) and single-crystalline (SC) gold nanowires with wellcontrolled<br />

crystallographic characteristics were obtained. Characterization of wires by<br />

X-ray diffraction (XRD), and transmission electron microscopy (TEM) confirmed that<br />

the SC gold wires contained no grain bo<strong>und</strong>aries and possess a strong 〈110〉<br />

preferred orientation. The PC wires exhibit a bamboo-like structure with the grain<br />

sizes varying between several h<strong>und</strong>red nanometers and few micrometers . Figure 1<br />

shows representative XRD diffractograms of both types of samples.<br />

Intensity (a.u.)<br />

111<br />

Cu<br />

200<br />

Cu<br />

220<br />

311<br />

222<br />

40 60 80 100<br />

2 Theta (deg)<br />

Fig. 1: XRD patterns of (a) single-crystalline and (b) poly-crystalline wires of diameter 87 nm.<br />

Cu reflections are ascribed to the Cu back-electrode.<br />

For the annealing experiments, the Polycarbonate matrix was dissolved. The<br />

samples were introduced in a vacuum furnace (~5×10 -4 Pa), heated up to a<br />

temperature<br />

- 92 -<br />

Cu<br />

(a)<br />

(b)

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