Scientific and Technical Aerospace Reports Volume 39 April 6, 2001
Scientific and Technical Aerospace Reports Volume 39 April 6, 2001
Scientific and Technical Aerospace Reports Volume 39 April 6, 2001
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<strong>2001</strong>0023276 Lembaga Penerbangan dan Antariksa Nasional, Space Communication Transmission, Jakarta, Indonesia<br />
Designing <strong>and</strong> Making a Helix Antenna for Low-Orbit Satellite Applications Perancangan Dan Pembuatan Antena Helix<br />
Untuk Aplikasi Satelit Orbit Rendah<br />
Ghozali, M., Lembaga Penerbangan dan Antariksa Nasional, Indonesia; Warta LAPAN; October 2000; ISSN 0126-9754; <strong>Volume</strong><br />
2, No. 4, pp. 165-171; In Malay-Indonesian; Copyright; Avail: Issuing Activity<br />
The helix antenna is an antenna which fulfill requirement for the low orbit satellite, I,e the pattern radiation of the antenna<br />
should be uni directional <strong>and</strong> if frequencies of communication of satellite are less than 1 GHz the radiation should be circular polarized.<br />
This paper describes how to design <strong>and</strong> producing the helix antenna that fulfill the above requirement. Besides, the computation<br />
of maximum gain, input impedance <strong>and</strong> half beam width are also describe.<br />
Author<br />
Antenna Design; Helical Antennas; Satellite Antennas; Telecommunication; Satellite Communication<br />
<strong>2001</strong>0023802 National Inst. of St<strong>and</strong>ards <strong>and</strong> Technology, Electronics <strong>and</strong> Electrical Engineering Lab., Gaithersburg, MD USA<br />
Electronics <strong>and</strong> Electrical Engineering Laboratory Strategic Plan for Fiscal Years <strong>2001</strong>-2006<br />
Feb. <strong>2001</strong>; 28p; In English<br />
Report No.(s): PB<strong>2001</strong>-102725; NISTIR-6712; No Copyright; Avail: CASI; A03, Hardcopy; A01, Microfiche<br />
The Electronics <strong>and</strong> Electrical Engineering Laboratory (EEEL) promotes U.S. economic growth by providing measurement<br />
capability of high impact focused primarily on the critical needs of the U.S. electronics <strong>and</strong> electrical industries, <strong>and</strong> their customers<br />
<strong>and</strong> suppliers. This measurement capability promotes economic growth by improving the competitiveness of U.S. This capability<br />
is part of the national infrastructure that helps attract <strong>and</strong> retain businesses <strong>and</strong> jobs in the USA. EEEL focuses on<br />
measurement capability that U.S. industries need but cannot provide for themselves, for technical, economic, or other reasons.<br />
The beneficiaries include U.S. industry, government, academia, other organizations, <strong>and</strong> the general public.<br />
NTIS<br />
Electrical Measurement; Electrical Engineering; Economics<br />
<strong>2001</strong>002<strong>39</strong>20 Materials Research Society, Warrendale, PA USA<br />
Materials Research Society Symposium Proceedings. <strong>Volume</strong> 623. Materials Science of Novel Oxide-Based Electronics<br />
Held in San Francisco, California on <strong>April</strong> 24-27, 2000<br />
Ginley, David S.; Perkins, John D.; Kawazoe, Hiroshi; Newns, Dennis M.; Kozyrev, Andrey B.; Apr. 27, 2000; 432p; In English<br />
Contract(s)/Grant(s): N00014-99-1-1048<br />
Report No.(s): AD-A385546; No Copyright; Avail: CASI; A19, Hardcopy; A04, Microfiche<br />
Contents of this document includes papers that covers applications, ferroelectrics <strong>and</strong> related materials, <strong>and</strong> film deposition<br />
methods.<br />
DTIC<br />
Oxides; Electronic Equipment; Composite Materials<br />
<strong>2001</strong>002<strong>39</strong>21 Illinois Univ. at Urbana-Champaign, Dept. of Electrical <strong>and</strong> Computer Engineering, Urbana, IL USA<br />
High-Frequency Measurements <strong>and</strong> Validation of Electromagnetic Models in Scattering, Interconnects <strong>and</strong> Optoelectronics<br />
Final Report, 1 Mar.-31 Aug. 1999<br />
Schutt-Aine, J. E., Illinois Univ. at Urbana-Champaign, USA; Chew, W. C., Illinois Univ. at Urbana-Champaign, USA; Chuang,<br />
S. L., Illinois Univ. at Urbana-Champaign, USA; Dec. 1999; 7p; In English<br />
Contract(s)/Grant(s): F49620-99-1-0160<br />
Report No.(s): AD-A385551; AFRL-SR-BL-TR-00-0812; No Copyright; Avail: CASI; A01, Microfiche; A02, Hardcopy<br />
The performance of radio frequency (RF) integrated circuits will strongly influence the versatility <strong>and</strong> portability of future<br />
wireless communication systems. With the ever increasing dem<strong>and</strong>s for higher b<strong>and</strong>-width <strong>and</strong> capacity as well as reductions in<br />
size weight <strong>and</strong> cost, the need for more robust <strong>and</strong> efficient RF circuits is expected to increase. Currently, millimeter-wave monolithic<br />
ICs (MMICs) chip sets are under development in the 24-94 GHz range <strong>and</strong> will represent the platform for the RF components<br />
of most wireless systems. With the recent advent of micro-electro-mechanical (MEM) systems, new potentials are being discovered<br />
for applications in the RF/millimeter wave ranges. Each of the MEM classes has produced compelling examples of working<br />
devices such as the tunable micromachined transmission line in the RF-extrinsic class, the shunt electrostatic microswitch capacitors<br />
in the RF-intrinsic class, <strong>and</strong> the capacitively coupled micromechanical resonator in the RF-reactive class.<br />
DTIC<br />
Electro-Optics; Integrated Circuits; Electromagnetic Scattering; Micromechanics; Microwave Circuits<br />
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