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a) b - École Polytechnique de Montréal

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AFM atomic force microscopy<br />

LIST OF ABBREVIATIONS<br />

BET Brunauer Emmett and Teller nitrogen adsorption technique<br />

CB carbon black<br />

CLSM confocal laser scanning microscopy<br />

CoPA copolyami<strong>de</strong><br />

CPC conductive polymer composite<br />

CPCM conducting polymer composite material<br />

CSA camphor-10-sulfonic acid<br />

DBSA do<strong>de</strong>cylbenzenesulfonic acid<br />

DMA dimethylacetami<strong>de</strong><br />

DMF dimethylformami<strong>de</strong><br />

DNNDSA dinonylnaphthalenedisulfonic acid<br />

DOP dioctyl phthalate<br />

EB emeraldine base<br />

FIB focused ion beam<br />

HA hyaluronan<br />

HDPE high <strong>de</strong>nsity polyethylene<br />

H-PMMA high molecular weigth poly(methyl methacrylate)<br />

ICP intrinsically conducting polymer<br />

LbL Layer-by-Layer technique<br />

LED light emitting dio<strong>de</strong><br />

LLDPE linear low <strong>de</strong>nsity polyethylene<br />

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