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software to fit optical spectra - Quantum Materials Group

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that time. The later development of RefFIT was <strong>to</strong> a great extent governed by a desire <strong>to</strong><br />

combine the best OPTPAL features with a user-friendly interface. The creative science<br />

atmosphere of Dirk’s group is very stimulating for me. I must specially acknowledge Patricio<br />

Mena, who helped me a lot <strong>to</strong> improve RefFIT by using it extensively in his PhD study and<br />

even writing several subroutines. And, of course, I want <strong>to</strong> thank all my colleagues who elected<br />

<strong>to</strong> use RefFIT as their computational <strong>to</strong>ol and thus furthered its evolution.<br />

1.2. What is RefFIT for?<br />

One can generally say that RefFIT is designed <strong>to</strong> analyze the <strong>optical</strong> <strong>spectra</strong> of solids.<br />

Clearly, this statement has <strong>to</strong> be a bit specified, because there are myriads of thinkable <strong>optical</strong><br />

experiments and, correspondingly, very different ways <strong>to</strong> analyze them. So which sort of data<br />

are we going <strong>to</strong> deal with and what for ‘analysis’ we are going <strong>to</strong> apply?<br />

First of all, by <strong>optical</strong> <strong>spectra</strong>, we mean frequency-dependent <strong>optical</strong> quantities. An<br />

example of an <strong>optical</strong> spectrum is the frequency-dependent reflectivity R (ω)<br />

, which can be<br />

directly measured. Another example is given by the <strong>optical</strong> conductivity σ (ω)<br />

, which is<br />

usually not measured directly but derived from experimental data after some analysis (or,<br />

alternatively, it can be taken from articles of other groups, which is also a sort of measurement<br />

☺). Of course, in addition <strong>to</strong> the light frequency there might be other experimental parameters,<br />

such as the angle of incidence, a sample thickness etc. Secondly, we put a common dogma, that<br />

the <strong>optical</strong> properties we deal with are determined solely by the complex dielectric function<br />

ε ( ω)<br />

= ε1<br />

( ω)<br />

+ iε<br />

2 ( ω)<br />

of the studied material. Thus, we assume that the measurable <strong>optical</strong><br />

quantities, such as reflection, transmission, ellipsometry outputs etc., are described by the<br />

textbook Fresnel equations [2].<br />

The primary goal of <strong>spectra</strong> analysis, that RefFIT does, is <strong>to</strong> get information about the<br />

material dielectric function on the base of <strong>optical</strong> <strong>spectra</strong>. It is done by the <strong>fit</strong>ting of these<br />

<strong>spectra</strong> using a model of the dielectric function with a set of adjustable parameters. These<br />

parameters are varied in order <strong>to</strong> obtain the best match between the experimental and calculated<br />

data points.<br />

There are two ways <strong>to</strong> model the dielectric function. It might be either a mathematical (or<br />

physical, if you like) formula with a limited number of parameters, or a variational (also called<br />

a ‘free-shape’) dielectric function, which is ‘allowed’ <strong>to</strong> vary independently at every frequency<br />

point [4] (see sections 2.2.4 and 2.2.5). The first possibility is very familiar <strong>to</strong> many (e.g., the<br />

Drude-Lorentz modeling of reflectivity). Although the second one might look uncommon, it is<br />

often implicitly present in the data analysis. For example, in spectroscopic ellipsometry ε 1 and<br />

ε 2 are extracted independently at every frequency from the two measured ellipsometric angles<br />

- ψ and ∆ . The same thing can be done in RefFIT by the <strong>fit</strong>ting of ε (ω)<br />

with a not-Kramers-<br />

Kronig-constrained variational dielectric function (section 2.2.5). Another example is the<br />

conventional Kramers-Kronig transformation of reflectivity [6] (used, by the way, in about<br />

90% of papers on infrared spectroscopy of solids), which can be substituted in RefFIT by the<br />

<strong>fit</strong>ting of R (ω)<br />

by a Kramers-Kronig-constrained variational dielectric function (section 2.2.4).<br />

To make a long s<strong>to</strong>ry short: every analysis that RefFIT does is a <strong>fit</strong>ting!<br />

Guide <strong>to</strong> RefFIT Page 5

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