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research activities in 2007 - CSEM

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Flip Chip Bond<strong>in</strong>g on Polymers – Die Attach and Leak-Tight Seal<strong>in</strong>g<br />

M. Fretz, T. Harvey • , J. Auerswald, N. Schmid, A-C. Pliska, C. Bosshard<br />

A bond<strong>in</strong>g process for sens<strong>in</strong>g elements on PMMA based platforms or vice versa was developed. A r<strong>in</strong>g of anisotropic conductive adhesive (ACA)<br />

forms a cavity between PMMA die and silicon platform. Seal<strong>in</strong>g tests were carried out. This process is suited for dies too small for a micro-gasket<br />

approach.<br />

As a low cost thermoplastic material, PMMA is specially suited<br />

for microfluidic applications and not only for disposable<br />

devices. Often a sample to be <strong>in</strong>spected must be guided to<br />

the appropriate sensor element through a fluidic channel or<br />

network. Hence, flip chip bond<strong>in</strong>g of the active element on a<br />

PMMA platform is a suitable <strong>in</strong>tegration approach. Two tasks<br />

arise: Flip chip bond<strong>in</strong>g must provide electrical contact, and<br />

the sens<strong>in</strong>g area of the chip must be hermetically closed<br />

aga<strong>in</strong>st the ambient air. Both can be achieved by the use of<br />

anisotropic conductive adhesive (ACA). In this report, the<br />

bond<strong>in</strong>g process of a PMMA die mounted on a silicon platform<br />

with a r<strong>in</strong>g of ACA is described. Electrical connection between<br />

PMMA and silicon was demonstrated before <strong>in</strong> [1] .<br />

2<br />

1<br />

3<br />

ACA r<strong>in</strong>g<br />

Cavity<br />

4<br />

Figure 1: Die attachment process: The gold studs are placed on the<br />

pads of a PMMA die (1) and flattened (2). Then the flipped die is<br />

mounted on the silicon platform (3), on which a r<strong>in</strong>g of anisotropic<br />

conductive adhesive was dispensed. F<strong>in</strong>ally, the cavity is connected<br />

to the seal<strong>in</strong>g test set up (4).<br />

First, two holes were drilled through the ~5 x 5 x 2 mm 3<br />

PMMA dies. Then, a standard wire bonder was used to place<br />

gold studs on the PMMA (see Figure 1). After gold stud<br />

bump<strong>in</strong>g, a r<strong>in</strong>g of ACA was dispensed on the silicon platform,<br />

followed by the attachment of the flipped PMMA die on the<br />

silicon (Figure 2). The attachment step is critical, because<br />

ACA requires heat (m<strong>in</strong>imum 125 °C) and pressure. But<br />

PMMA will warp under load when exposed to temperatures<br />

above ~100 °C (for more details, see [1] ). Tests were carried<br />

out to evaluate the seal<strong>in</strong>g quality of the ACA: Air was<br />

pumped through the cavity which was connected to a dead<br />

end pressure sensor (for more details, see [2] ).The pressure<br />

was <strong>in</strong>creased until it exceeded 1 bar. Then the leakage of the<br />

cavity was measured for ten m<strong>in</strong>utes, as well as the leakage<br />

of the tub<strong>in</strong>g system alone. The result is plotted <strong>in</strong> Figure 3.<br />

No breakdown of the pressure was observed with<strong>in</strong> twenty<br />

m<strong>in</strong>utes. The decrease <strong>in</strong> pressure is due to the tub<strong>in</strong>g and<br />

connectors, as Figure 3 shows. Seal<strong>in</strong>g with ACA can,<br />

therefore, be a suitable approach for microfluidic applications<br />

which require flip chip bond<strong>in</strong>g of small dies.<br />

Metal pads<br />

ACA r<strong>in</strong>g<br />

Drilled holes<br />

Figure 2: 5 x 5 mm 2 PMMA dies mounted on a dummy silicon<br />

platform with anisotropic conductive adhesive.<br />

Figure 3: Leak measurement: The red po<strong>in</strong>ts (-) depict the pressure<br />

evolution <strong>in</strong> the tub<strong>in</strong>g system only. The blue crosses (x) <strong>in</strong>clude both<br />

the device with the cavity and the tub<strong>in</strong>g.<br />

The work was supported by the EU, (project IST-FP6-027540,<br />

IntegramPLUS). <strong>CSEM</strong> thanks T. Harvey from Epigem for the<br />

preparation of the PMMA substrates.<br />

•<br />

Epigem Limited, Redcar, UK<br />

[1] M. Fretz, et al., “Flip Chip Bond<strong>in</strong>g on Polymers: A Die<br />

Attachment Method for Low Tg Materials”, <strong>CSEM</strong> Scientific and<br />

Technical Report 2006, page 88<br />

[2] J. Auerswald, et al., “Bond<strong>in</strong>g of Glass Sensor Chips with Low-<br />

Cost Thermoplastic Microfluidic Scaffolds”, <strong>CSEM</strong> Scientific and<br />

Technical Report 2006, page 87<br />

99

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