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116 Literaturverzeichnis
[39] N. J. Harrick. Study of Physics and Chemistry of Surfaces from Frustrated
Total Internal Reflections. Phys. Rev. Lett., 4(5):224 (1960).
[40] J. Fahrenfort. Attenuated total reflection: A new principle for the production
of useful infra-red reflection spectra of organic compounds. Spectrocimica
Acta., 17:698 (1961).
[41] A. Otto. Excitation of nonradiative surface plasma waves in silver by the
method of frustrated total reflection. Z. Phys., 216:398 (1968).
[42] E. Kretschmann. Die Bestimmung optischer Konstanten von Metallen durch
Anregung von Oberflächenplasmaschwingungen. Z. Phys., 241:313 (1971).
[43] J. W. Goodman. Introduction to Fourier Optics. McGraw-Hill Book Company
(1968).
[44] E. Hecht. Optik. Oldenbourg Wissenschaftsverlag (2005).
[45] E. Abbe. Beiträge zur Theorie des Mikroskops und der mikroskopischen
Wahrnehmung. Arch. Mikrosk. Anat., 9(1):413 (1873).
[46] E. Wolf und M. Born. Principles of Optics - 7th (expanded) edition. Cambridge
University Press (2002).
[47] H. A. Bethe. Theory of diffraction by small holes. Phys. Rev., 66(7-8):163
(1944).
[48] C. J. Bouwkamp. On Bethe’s Theory of Diffraction by Small Holes. Philips
Res. Rep., 5:321 (1950).
[49] A. Roberts. Electromagnetic theory of diffraction by a circular aperture in a
thick, perfectly conducting screen. J. Opt. Soc. Am. A, 4(10):1970 (1987).
[50] A. Roberts. Small-hole coupling of radiation into a near-field probe. J. Appl.
Phys., 70(8):4045 (1991).
[51] D. Van Labeke und D. Barchiesi. Scanning-tunneling optical microscopy: a
theoretical macroscopic approach. J. Opt. Soc. Am. A, 9(5):732 (1992).
[52] D. Van Labeke, D. Barchiesi und F. Baida. Optical characterization of
nanosources used in scanning near-field optical microscopy. J. Opt. Soc. Am.
A, 12(4):695 (1995).
[53] L. Novotny, D. W. Pohl und P. Regli. Near-field, far-field and imaging
properties of the 2D aperture SNOM. Ultramicroscopy, 57:180 (1995).
[54] P. M. Conn. Confocal microscopy. Academic Press (1999).
[55] A. Diaspro. Confocal and two-photon microscopy: foundations, applications and
advances. Wiley (2002).