View/Open - JUWEL - Forschungszentrum Jülich
View/Open - JUWEL - Forschungszentrum Jülich
View/Open - JUWEL - Forschungszentrum Jülich
Sie wollen auch ein ePaper? Erhöhen Sie die Reichweite Ihrer Titel.
YUMPU macht aus Druck-PDFs automatisch weboptimierte ePaper, die Google liebt.
122 Literaturverzeichnis<br />
[125] D. Turner. US Patent 4,469,554.<br />
[126] G. A. Valaskovic, M. Holton und G. H. Morrison. Parameter control,<br />
characterization, and optimization in the fabrication of optical fiber nearfield<br />
probes. Appl. Opt., 34(7):1215 (1995).<br />
[127] P. Hoffmann, B. Dutoit und R.-P. Salathé. Comparison of mechanically<br />
drawn and protection layer chemically etched optical fiber tips. Ultramicroscopy,<br />
61:165 (1995).<br />
[128] M. N. Islam, X. K. Zhao, A. A. Said, S. S. Mickel und C. F. Vail. Highefficiency<br />
and high-resolution fiber-optic probes for near field imaging and<br />
spectroscopy. Appl. Phys. Lett., 71(20):2886 (1997).<br />
[129] E. Betzig, P. L. Finn und J. S. Weiner. Combined shear force and near-field<br />
scanning optical microscopy. Appl. Phys. Lett., 60(20):2484 (1992).<br />
[130] K. Karrai und R. D. Grober. Piezoelectric tip-sample distance control for<br />
near field optical microscopes. Appl. Phys. Lett., 66(14):1842 (1995).<br />
[131] M. Lippitz, M. Schüttler, H. Giessen, M. Born und W. W. Rühle. Bandwidth<br />
enhancement of a shear-force-controlled distance regulation in near-field<br />
microscopy. J. Appl. Phys., 86(1):100 (1999).<br />
[132] H. Brückl, F. Matthes und G. Reiss. Direct measurement of the oscillation<br />
amplitude and criteria for high-quality images in shear force microscopy.<br />
Appl. Phys. A, 66:345 (1998).<br />
[133] S. Davy, M. Spajer und D. Courjon. Influence of the water layer on the<br />
shear force damping in near-field microscopy. Appl. Phys. Lett., 73(18):2594<br />
(1998).<br />
[134] F. Matthes, H. Brückl und G. Reiss. Near-field magneto-optical microscopy<br />
in collection and illumination mode. Ultramicroscopy, 71:243 (1998).<br />
[135] A. C. Boccara, D. Fournier und J. Badoz. Thermo-optical spectroscopy:<br />
Detection by the ”mirage effect”. Appl. Phys. Lett., 36(2):130 (1980).<br />
[136] W. B. Jackson, N. M. Amer, A. C. Boccara und D. Fournier. Photothermal<br />
deflection spectroscopy and detection. Appl. Opt., 20(8):1333 (1981).<br />
[137] F. Becker, R. Carius, J.-T. Tettler, J. Klomfass, C. Walker und H. Wagner.<br />
Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions<br />
and Determination of the Interface Defect Densities. Materials<br />
Science Forum, 173-174:177 (1995).<br />
[138] N. Höhne. PDS als Charakterisierungsmethode für Dünnschichtsolarzellen aus<br />
amorphem Silizium. Diplomarbeit, RWTH Aachen (1997).