Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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<strong>TEM</strong> Specimens and Images 105<br />
as seen in Fig. 4-10. However, the shadows appear dark in a pho<strong>to</strong>graphic<br />
negative or if the contrast is reversed in an electronically recorded image.<br />
The result is a realistic three-dimensional appearance, similar <strong>to</strong> that <strong>of</strong><br />
oblique illumination <strong>of</strong> a rough surface by light.<br />
Besides increasing contrast, shadowing allows the height h <strong>of</strong> a protruding<br />
surface feature <strong>to</strong> be estimated by measurement <strong>of</strong> its shadow length. As<br />
shown in Fig. 4-9, the shadow length L is given by:<br />
h = L tan� (4.19)<br />
Therefore, h can be measured if the shadowing has been carried out at a<br />
known angle <strong>of</strong> incidence �. Shadowing has also been used <strong>to</strong> ensure the<br />
visibility <strong>of</strong> small objects such as virus particles or DNA molecules,<br />
mounted on a thin-carbon support film.<br />
C replica<br />
�<br />
Pt layer<br />
Figure 4-9. Shadowing <strong>of</strong> a surface replica by platinum a<strong>to</strong>ms deposited at an angle � relative<br />
<strong>to</strong> the surface.<br />
Figure 4-10. Bright-field image (M � 30,000) <strong>of</strong> a platinum-shadowed carbon replica <strong>of</strong> PbSe<br />
crystallites, as it appears on the <strong>TEM</strong> screen. Compare the contrast with that <strong>of</strong> Fig. 4-8.<br />
h<br />
L<br />
�