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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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198 Index<br />

Bright-field image, 100<br />

Brightness, 65<br />

conservation <strong>of</strong>, 66, 72<br />

Camera length, 110<br />

Cathode material, 60<br />

Cathode-ray tube, 34, 127<br />

Cathodoluminescence, 134<br />

CCD camera, 86<br />

Charging effects, 147<br />

Cleavage, 120<br />

Coefficient,<br />

backscattering, 137<br />

chromatic, 51<br />

spherical-aberration, 45<br />

Coherence, 185<br />

Coma, 54<br />

Condenser aperture, 74, 72<br />

Condenser lenses, 70<br />

Condenser-objective lens, 79<br />

Contamination, 92, 82, 152<br />

Confusion,<br />

Airy disk <strong>of</strong>, 4<br />

aberration disk, 33, 47, 49<br />

disk <strong>of</strong> least, 46<br />

focusing disk <strong>of</strong>, 28<br />

Contrast,<br />

a<strong>to</strong>mic-number, 101<br />

diffraction, 106<br />

light-microscope, 6<br />

mass-thickness, 101<br />

phase, 115<br />

scattering, 101, 80<br />

thickness-gradient, 104<br />

<strong>to</strong>pographical, 131�148<br />

Convergence angle, 66, 72<br />

Cornea, 2<br />

Coulomb interaction, 93<br />

Cross section for scattering, 97<br />

Crossover, 71<br />

Curvature <strong>of</strong> field, 29, 55<br />

Dedicated S<strong>TEM</strong>, 19, 177<br />

Depth <strong>of</strong> field,<br />

in <strong>TEM</strong>, 88, 55<br />

in SEM, 145, 18<br />

Depth <strong>of</strong> focus,<br />

in <strong>TEM</strong>, 87<br />

Defects,<br />

crystal, 14, 112, 122, 141<br />

lens, 27, 30, 44, 185<br />

Detec<strong>to</strong>r,<br />

ADF, 177<br />

Everhart-Thornley, 135<br />

in-lens, 136<br />

Robinson, 138<br />

solid-state, 138<br />

x-ray, 161, 168, 9<br />

Diaphragm,<br />

<strong>of</strong> the eye, 3<br />

<strong>TEM</strong> condenser, 72<br />

<strong>TEM</strong> objective, 80<br />

Diffraction,<br />

light-optical, 3<br />

electron, 106, 11<br />

Diffraction contrast, 108<br />

Diffraction pattern, 108<br />

Dark-field image, 108<br />

Dead time, 164<br />

Disk <strong>of</strong> confusion, 4, 28, 33<br />

Disk <strong>of</strong> least confusion, 46<br />

Dislocations, 14, 112, 183<br />

Dispersion,<br />

electron, 172<br />

pho<strong>to</strong>n, 33, 142, 161, 168<br />

Dis<strong>to</strong>rtion, 28, 54<br />

Drift,<br />

beam-current, 61<br />

high-voltage, 70, 43, 49<br />

illumination, 75<br />

specimen, 75, 77, 78<br />

STM, 24<br />

Dynamics <strong>of</strong> scattering, 97

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