Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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198 Index<br />
Bright-field image, 100<br />
Brightness, 65<br />
conservation <strong>of</strong>, 66, 72<br />
Camera length, 110<br />
Cathode material, 60<br />
Cathode-ray tube, 34, 127<br />
Cathodoluminescence, 134<br />
CCD camera, 86<br />
Charging effects, 147<br />
Cleavage, 120<br />
Coefficient,<br />
backscattering, 137<br />
chromatic, 51<br />
spherical-aberration, 45<br />
Coherence, 185<br />
Coma, 54<br />
Condenser aperture, 74, 72<br />
Condenser lenses, 70<br />
Condenser-objective lens, 79<br />
Contamination, 92, 82, 152<br />
Confusion,<br />
Airy disk <strong>of</strong>, 4<br />
aberration disk, 33, 47, 49<br />
disk <strong>of</strong> least, 46<br />
focusing disk <strong>of</strong>, 28<br />
Contrast,<br />
a<strong>to</strong>mic-number, 101<br />
diffraction, 106<br />
light-microscope, 6<br />
mass-thickness, 101<br />
phase, 115<br />
scattering, 101, 80<br />
thickness-gradient, 104<br />
<strong>to</strong>pographical, 131�148<br />
Convergence angle, 66, 72<br />
Cornea, 2<br />
Coulomb interaction, 93<br />
Cross section for scattering, 97<br />
Crossover, 71<br />
Curvature <strong>of</strong> field, 29, 55<br />
Dedicated S<strong>TEM</strong>, 19, 177<br />
Depth <strong>of</strong> field,<br />
in <strong>TEM</strong>, 88, 55<br />
in SEM, 145, 18<br />
Depth <strong>of</strong> focus,<br />
in <strong>TEM</strong>, 87<br />
Defects,<br />
crystal, 14, 112, 122, 141<br />
lens, 27, 30, 44, 185<br />
Detec<strong>to</strong>r,<br />
ADF, 177<br />
Everhart-Thornley, 135<br />
in-lens, 136<br />
Robinson, 138<br />
solid-state, 138<br />
x-ray, 161, 168, 9<br />
Diaphragm,<br />
<strong>of</strong> the eye, 3<br />
<strong>TEM</strong> condenser, 72<br />
<strong>TEM</strong> objective, 80<br />
Diffraction,<br />
light-optical, 3<br />
electron, 106, 11<br />
Diffraction contrast, 108<br />
Diffraction pattern, 108<br />
Dark-field image, 108<br />
Dead time, 164<br />
Disk <strong>of</strong> confusion, 4, 28, 33<br />
Disk <strong>of</strong> least confusion, 46<br />
Dislocations, 14, 112, 183<br />
Dispersion,<br />
electron, 172<br />
pho<strong>to</strong>n, 33, 142, 161, 168<br />
Dis<strong>to</strong>rtion, 28, 54<br />
Drift,<br />
beam-current, 61<br />
high-voltage, 70, 43, 49<br />
illumination, 75<br />
specimen, 75, 77, 78<br />
STM, 24<br />
Dynamics <strong>of</strong> scattering, 97