Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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136 Chapter 5<br />
Because each secondary produced at the SEM specimen generated about<br />
100 pho<strong>to</strong>electrons, the overall amplification (gain) <strong>of</strong> the PMT/scintilla<strong>to</strong>r<br />
combination can be as high as 10 8 , depending on how much accelerating<br />
voltage is applied <strong>to</strong> the dynodes. Although this conversion <strong>of</strong> SEM<br />
secondaries in<strong>to</strong> pho<strong>to</strong>ns, then in<strong>to</strong> pho<strong>to</strong>electrons and finally back in<strong>to</strong><br />
secondary electrons seems complicated, it is justified by the fact that the<br />
detec<strong>to</strong>r provides high amplification with relatively little added noise.<br />
In some high-resolution SEMs, the objective lens has a small focal length<br />
(a few millimeters) and the specimen is placed very close <strong>to</strong> it, within the<br />
magnetic field <strong>of</strong> the lens (immersion-lens configuration). Secondary<br />
electrons emitted close <strong>to</strong> the optic axis follow helical trajec<strong>to</strong>ries, spiraling<br />
around the magnetic-field lines and emerging above the objective lens,<br />
where they are attracted <strong>to</strong>ward a positively-biased detec<strong>to</strong>r. Because the<br />
signal from such an in-lens detec<strong>to</strong>r (or through-the-lens detec<strong>to</strong>r)<br />
corresponds <strong>to</strong> secondaries emitted almost perpendicular <strong>to</strong> the specimen<br />
surface, positive and negative values <strong>of</strong> � (Fig. 5-6a) provide equal signal.<br />
Consequently, the SE image shows no directional or shadowing effects, as<br />
illustrated in Fig. 5-9b.<br />
In-lens detection is <strong>of</strong>ten combined with energy filtering <strong>of</strong> the secondary<br />
electrons that form the image. For example, a Wien-filter arrangement<br />
(Section 7.3) can be used <strong>to</strong> select higher-energy secondaries, which consist<br />
mainly <strong>of</strong> the higher-resolution SE1 component (Section 5.6).<br />
Figure 5-9. Compound eye <strong>of</strong> an insect, coated with gold <strong>to</strong> make the specimen conducting.<br />
(a) SE image recorded by a side-mounted detec<strong>to</strong>r (located <strong>to</strong>ward the <strong>to</strong>p <strong>of</strong> the page) and<br />
showing a strong directional effect, including dark shadows visible below each dust particle.<br />
(b) SE image recorded by an in-lens detec<strong>to</strong>r, showing <strong>to</strong>pographical contrast but very little<br />
directional or shadowing effect. Courtesy <strong>of</strong> Peng Li, University <strong>of</strong> Alberta.