Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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62 Chapter 3<br />
electron<br />
emission<br />
current<br />
small R b<br />
large R b<br />
saturation point<br />
cathode temperature or filament heating current<br />
Figure 3-3. Emission current I e as a function <strong>of</strong> cathode temperature, for thermionic emission<br />
from an au<strong>to</strong>biased (tungsten or LaB6) cathode.<br />
area according <strong>to</strong> the feedback mechanism just described, so Ie increases<br />
rapidly with filament temperature T, as expected from Eq. (3.1). As the<br />
filament temperature is further increased, the negative feedback mechanism<br />
starts <strong>to</strong> operate: the beam current becomes approximately independent <strong>of</strong><br />
filament temperature and is said <strong>to</strong> be saturated. The filament heating<br />
current (which is adjustable by the <strong>TEM</strong> opera<strong>to</strong>r, by turning a knob) should<br />
never be set higher than the value required for current saturation. Higher<br />
values give very little increase in beam current and would result in a<br />
decrease in source lifetime, due <strong>to</strong> evaporation <strong>of</strong> W or LaB6 from the<br />
cathode. The change in Ie shown in Fig. 3-1 can be moni<strong>to</strong>red from an<br />
emission-current meter or by observing the brightness <strong>of</strong> the <strong>TEM</strong> screen,<br />
allowing the filament current <strong>to</strong> be set appropriately. If the beam current<br />
needs <strong>to</strong> be changed, this is done using a bias-control knob that selects a<br />
different value <strong>of</strong> Rb , as indicated in Fig. 3-3.<br />
Schottky emission<br />
The thermionic emission <strong>of</strong> electrons can be increased by applying an<br />
electrostatic field <strong>to</strong> the cathode surface. This field lowers the height <strong>of</strong> the<br />
potential barrier (which keeps electrons inside the cathode) by an amount ��<br />
(see Fig. 3-4), the so-called Schottky effect. As a result, the emissioncurrent<br />
density Je is increased by a fac<strong>to</strong>r exp(��/kT), typically a fac<strong>to</strong>r <strong>of</strong> 10<br />
as demonstrated in the Appendix.<br />
A Schottky source consists <strong>of</strong> a pointed crystal <strong>of</strong> tungsten welded <strong>to</strong> the<br />
end <strong>of</strong> V-shaped tungsten filament. The tip is coated with zirconium oxide<br />
(ZrO) <strong>to</strong> provide a low work function (� 2.8 eV) and needs <strong>to</strong> be heated <strong>to</strong>