- Page 2 and 3: Physical Principles of Electron Mic
- Page 4 and 5: Ray F. Egerton Department of Physic
- Page 6 and 7: Contents Preface xi 1. An Introduct
- Page 8 and 9: Contents ix 7. Recent Developments
- Page 10 and 11: xii Preface textbooks, such as Will
- Page 12 and 13: 2 1.1 Limitations of the Human Eye
- Page 14 and 15: 4 Chapter 1 parallel beam of light
- Page 16 and 17: 6 Chapter 1 Figure 1-3. One of the
- Page 18 and 19: 8 Chapter 1 Figure 1-5. Light-micro
- Page 20 and 21: 10 Chapter 1 Figure 1-7. Scanning t
- Page 24 and 25: 14 Chapter 1 Figure 1-10. JEOL tran
- Page 26 and 27: 16 Chapter 1 hydrated. But high-ene
- Page 28 and 29: 18 Chapter 1 Figure 1-14. Scanning
- Page 30 and 31: 20 Chapter 1 Figure 1-16. Photograp
- Page 32 and 33: 22 Chapter 1 visible-light photons
- Page 34 and 35: 24 Chapter 1 Typically, the STM hea
- Page 36 and 37: Chapter 2 ELECTRON OPTICS Chapter 1
- Page 38 and 39: Electron Optics 29 a c b object len
- Page 40 and 41: Electron Optics 31 � a n 2 ~1.5
- Page 42 and 43: Electron Optics 33 We can define im
- Page 44 and 45: Electron Optics 35 electron source
- Page 46 and 47: Electron Optics 37 symmetry and use
- Page 48 and 49: Electron Optics 39 As we said earli
- Page 50 and 51: Electron Optics 41 2.4 Focusing Pro
- Page 52 and 53: Electron Optics 43 � = [e/(8mE0)
- Page 54 and 55: Electron Optics 45 image plane. Whe
- Page 56 and 57: Electron Optics 47 procedure that i
- Page 58 and 59: Electron Optics 49 The basic physic
- Page 60 and 61: Electron Optics 51 From Eq. (2.7),
- Page 62 and 63: Electron Optics 53 y +V 1 +V 2 -V 2
- Page 64 and 65: Electron Optics 55 point from the o
- Page 66 and 67: 58 Chapter 3 3.1 The Electron Gun T
- Page 68 and 69: 60 Chapter 3 The rate of electron e
- Page 70 and 71: 62 Chapter 3 electron emission curr
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64 Chapter 3 As seen from the right
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66 Chapter 3 � r r s r � (a) (b
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68 Chapter 3 Table 3-2. Speed v and
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70 Chapter 3 where G is a large amp
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72 Chapter 3 The second condenser (
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74 Chapter 3 Figure 3-9 summarizes
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76 Chapter 3 resolution (especially
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78 Chapter 3 The major advantage of
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80 Chapter 3 contrast (for a given
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82 Chapter 3 A more correct procedu
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84 Chapter 3 diffraction pattern (s
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86 Chapter 3 Nowadays, photographic
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88 Chapter 3 A related concept is d
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90 Chapter 3 molecules, imparting a
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92 Chapter 3 Frequently, liquid nit
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94 Chapter 4 -e -e -e -e +Ze Figure
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96 Chapter 4 � (a) elastic z x m
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98 Chapter 4 � b a (a) (b) Figure
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100 Chapter 4 fraction of electrons
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102 Chapter 4 whose composition or
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104 Chapter 4 replica crystallites
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106 Chapter 4 4.5 Diffraction Contr
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108 Chapter 4 remain undiffracted (
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110 Chapter 4 Close examination of
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112 Chapter 4 Unfortunately, the va
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114 Chapter 4 Crystals can also con
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116 Chapter 4 A simple example of p
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118 Chapter 4 High-magnification ph
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120 Chapter 4 At this stage it is c
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122 Chapter 4 All of the above meth
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124 Chapter 4 The procedures outlin
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126 Chapter 5 specimen scan coils o
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128 Chapter 5 functions with m and
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130 Chapter 5 inelastic collisions
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132 Chapter 5 Figure 5-5. Dependenc
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134 Chapter 5 Figure 5-7. (a) Secon
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136 Chapter 5 Because each secondar
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138 Chapter 5 Backscattered electro
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140 Chapter 5 Whereas Ip remains co
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142 Chapter 5 Figure 5-14. Red, gre
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144 Chapter 5 the SE2 and SE3 compo
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146 Chapter 5 just-observable loss
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148 Chapter 5 Section 4-10. Films o
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150 Chapter 5 A backscattered-elect
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152 Chapter 5 One example of this p
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Chapter 6 ANALYTICAL ELECTRON MICRO
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Analytical Electron Microscopy 157
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Analytical Electron Microscopy 159
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Analytical Electron Microscopy 161
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Analytical Electron Microscopy 163
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Analytical Electron Microscopy 165
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Analytical Electron Microscopy 167
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Analytical Electron Microscopy 169
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Analytical Electron Microscopy 171
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Analytical Electron Microscopy 173
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Analytical Electron Microscopy 175
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178 Chapter 7 Figure 7-1. Modified
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180 Chapter 7 7.2 Aberration Correc
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182 Chapter 7 Besides decreasing th
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184 Chapter 7 7.4 Electron Holograp
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186 Chapter 7 There are now many al
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188 Chapter 7 holography could ther
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Appendix MATHEMATICAL DERIVATIONS A
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Mathematical Derivations 193 A.2 Im
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REFERENCES Binnig, G., Rohrer, H.,
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INDEX Aberrations, 3, 28 axial, 44
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Index 199 EELS, 172 Electromagnetic
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Index 201 Principal plane, 32, 80 P