Physical Principles of Electron Microscopy: An Introduction to TEM ...

Index 201
Principal plane, 32, 80
Probe,
electron, 17, 126
scanning, 21
Prism
glass, 30
magnetic, 172
Pulse-height analysis, 163
Pump,
cryo, 91
diffusion, 89
ion, 90
rotary, 88
turbomolecular, 90
Pupil of the eye, 3
Quantum number, 155
Quadrupole, 52, 54, 173
Raster scanning, 17, 126
Radiation damage, 151, 182
Ray diagram, 32, 34
Rayleigh criterion, 4, 81
Refractive index, 8, 30
Relativistic mass, 68
Replica, 103
Resist, 151
Resistor,
bias, 61, 70
feedback, 69
Resolution,
of eye, 5
of light microscope, 6
of retina, 4
of SEM, 144, 125, 126
of TEM, 82, 180, 182
Richardson law, 59
Ripple, 43, 49, 69
Ronchigram, 182
Rotation angle of image, 42
Rutherford scattering, 93, 193
Rydberg energy, 155
Saturated filament, 62
Scanning,
digital, 127
raster, 126, 17
Scattering, 93
angular distribution, 97
cross section, 97
elastic, 96
inelastic, 96, 49
Scattering contrast, 80
Scintillator, 134
Secondary electrons, 17
Screen,
SEM display, 128
TEM viewing, 85
Screening, 99
SEM, 17, 125
environmental, 149
low-voltage, 149
SE1 component, 143
Shadowing, 104, 136
Single scattering, 99
Spatial resolution,
of the retina, 4
of the eye, 5
of a light microscope, 6
Specimen,
amorphous, 100
cross-sectional, 124
insulating, 148
polycrystalline, 96
single-crystal, 112
TEM thickness, 101, 88
Specimen preparation,
SEM, 147
TEM, 119
Specimen stage, 75, 57
Spectroscopy,
Auger, 171
energy-loss, 172
x-ray, 161, 168
Staining, 6, 15, 101